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Description
Working ConditionConfiguration
Has a 50KV (5nm claim of resolution, but got sub 20nm). Uses unix and Xwindows The system has W as a GIS, the gas injection was capped off, but could be modified for 4 gases (4 nozzles are present). Was modified with a side-angled port on the system for adding a nanomanipulator that was only used for a month or soOEM Model Description
Focused Ion Beam (FIB) SystemDocuments
THERMOFISHER SCIENTIFIC / FEI / MICRION
2500
Verified
CATEGORY
Inspection Equipment
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
82803
Wafer Sizes:
Unknown
Vintage:
Unknown
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Available
Money Back Guarantee
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Refurbishment Services
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View AllTHERMOFISHER SCIENTIFIC / FEI / MICRION
2500
CATEGORY
Inspection Equipment
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
82803
Wafer Sizes:
Unknown
Vintage:
Unknown
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available