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COHU / LTX-CREDENCE SAPPHIRE
    Description
    LTX Credence Semiconductor Tester, 97173001-07 PDU-Sapphire, 3300034-01 Sapphire, HD6C-25,27,29 PDU-Sapphire, 3300034-01 Power Conditioner NP Test 40152065 PCB, 97152065, SM Distribution, 97152065-02 Corcom 36FCD10 EMI Filter Panel Mount Power Line EMI RFI 3-Phase Filter, 36A, 277/480VAC ESMO, DPI, SVCSAP114, BDX-DE/ML, HSX-EP, SVCSAP114
    Configuration
    No Configuration
    OEM Model Description
    Sapphire is our next generation high performance SoC configurable test platform. First shipped by NPTest in December 2003, it is designed to be a highly reconfigurable and scalable functional and structural tester for a wide range of ICs. All of Sapphire’s test electronics are integrated in the test head and interconnected by a proprietary high bandwidth bus, which results in a lower cost platform and a smaller footprint. Sapphire can be used for design debug and validation, characterization, wafer sort and final test. The design supports a broad configuration range of up to 5,000 pins and a performance envelope that ranges from 200 MHz to 6.4 GHz.
    Documents

    No documents

    COHU / LTX-CREDENCE

    SAPPHIRE

    verified-listing-icon

    Verified

    CATEGORY
    Final Test

    Last Verified: Over 60 days ago

    Key Item Details

    Condition:

    Used


    Operational Status:

    Unknown


    Product ID:

    64072


    Wafer Sizes:

    Unknown


    Vintage:

    Unknown


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Similar Listings
    View All
    COHU / LTX-CREDENCE SAPPHIRE

    COHU / LTX-CREDENCE

    SAPPHIRE

    Final Test
    Vintage: 2007Condition: Used
    Last VerifiedOver 60 days ago

    COHU / LTX-CREDENCE

    SAPPHIRE

    verified-listing-icon
    Verified
    CATEGORY
    Final Test
    Last Verified: Over 60 days ago
    listing-photo-e9a511ce77ed4321834b25b45b968fcc-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/2028/e9a511ce77ed4321834b25b45b968fcc/ca98f1926cdd455798fc4a7c11737bce_cb10f695ce4643fcb2653931929a5c37_mw.jpeg
    listing-photo-e9a511ce77ed4321834b25b45b968fcc-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/2028/e9a511ce77ed4321834b25b45b968fcc/06d076fa1410414bbbe7bf79b218a079_5841c76c2a69404c89b17d97ddd061dd1201a_mw.jpeg
    listing-photo-e9a511ce77ed4321834b25b45b968fcc-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/2028/e9a511ce77ed4321834b25b45b968fcc/66f5988426fc4e5a986d913e64bf45b2_ff962325fe474b3c9b1def796fa8fd801201a_mw.jpeg
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    listing-photo-e9a511ce77ed4321834b25b45b968fcc-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/2028/e9a511ce77ed4321834b25b45b968fcc/68d00b6072534015a1122903dde7b8ea_72d8d2f10bb043e5b94cc408213eb8af_mw.jpeg
    listing-photo-e9a511ce77ed4321834b25b45b968fcc-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/2028/e9a511ce77ed4321834b25b45b968fcc/c1935dd119294635bccc2e4c5fe6818f_8015b54b25c145f5b160905fb8c737c6_mw.jpeg
    Key Item Details

    Condition:

    Used


    Operational Status:

    Unknown


    Product ID:

    64072


    Wafer Sizes:

    Unknown


    Vintage:

    Unknown


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Description
    LTX Credence Semiconductor Tester, 97173001-07 PDU-Sapphire, 3300034-01 Sapphire, HD6C-25,27,29 PDU-Sapphire, 3300034-01 Power Conditioner NP Test 40152065 PCB, 97152065, SM Distribution, 97152065-02 Corcom 36FCD10 EMI Filter Panel Mount Power Line EMI RFI 3-Phase Filter, 36A, 277/480VAC ESMO, DPI, SVCSAP114, BDX-DE/ML, HSX-EP, SVCSAP114
    Configuration
    No Configuration
    OEM Model Description
    Sapphire is our next generation high performance SoC configurable test platform. First shipped by NPTest in December 2003, it is designed to be a highly reconfigurable and scalable functional and structural tester for a wide range of ICs. All of Sapphire’s test electronics are integrated in the test head and interconnected by a proprietary high bandwidth bus, which results in a lower cost platform and a smaller footprint. Sapphire can be used for design debug and validation, characterization, wafer sort and final test. The design supports a broad configuration range of up to 5,000 pins and a performance envelope that ranges from 200 MHz to 6.4 GHz.
    Documents

    No documents

    Similar Listings
    View All
    COHU / LTX-CREDENCE SAPPHIRE

    COHU / LTX-CREDENCE

    SAPPHIRE

    Final TestVintage: 2007Condition: UsedLast Verified:Over 60 days ago
    COHU / LTX-CREDENCE SAPPHIRE

    COHU / LTX-CREDENCE

    SAPPHIRE

    Final TestVintage: 0Condition: UsedLast Verified:Over 60 days ago
    COHU / LTX-CREDENCE SAPPHIRE

    COHU / LTX-CREDENCE

    SAPPHIRE

    Final TestVintage: 0Condition: UsedLast Verified:Over 30 days ago