Description
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The Agilent 4072B Advanced Parametric Tester is designed to perform fast and precise DC measurements, capacitance measurements, flash memory cell tests, and other high-frequency applications. The system supports up to eight Source Monitor Units (SMUs). Each SMU is self-calibrating, and can be individually configured to force either current or voltage, as well as simultaneously measure either current or voltage.Documents
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KEYSIGHT / AGILENT / HEWLETT-PACKARD (HP)
4072B
Verified
CATEGORY
Final Test
Last Verified: 28 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
108845
Wafer Sizes:
8"/200mm
Vintage:
Unknown
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
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KEYSIGHT / AGILENT / HEWLETT-PACKARD (HP)
4072B
CATEGORY
Final Test
Last Verified: 28 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
108845
Wafer Sizes:
8"/200mm
Vintage:
Unknown
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
No descriptionConfiguration
No ConfigurationOEM Model Description
The Agilent 4072B Advanced Parametric Tester is designed to perform fast and precise DC measurements, capacitance measurements, flash memory cell tests, and other high-frequency applications. The system supports up to eight Source Monitor Units (SMUs). Each SMU is self-calibrating, and can be individually configured to force either current or voltage, as well as simultaneously measure either current or voltage.Documents
No documents