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Description
Advantest B6700L Memory Burn-In Test System, 200/208V, 3ph, 50/60Hz, 12-board capacity, WUN-B6700C racks, Hitachi HF-W2000 control computer. Mfg 2019. 76in x 80in x 78in HConfiguration
No ConfigurationOEM Model Description
B6700L has the same resources as the B6700D while accommodating a wider temperature range. The ability to perform temperature-controlled testing from -40° C to +150° C in one-tenth of a degree increments makes this system well suited for reliability and automotive-device testing. The B6700L also can simultaneously test up to 12 B6700D-compatible burn-in boards (BIB) and test programs.Documents
No documents
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
124148
Wafer Sizes:
Unknown
Vintage:
2019
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
ADVANTEST
B6700L
CATEGORY
Final Test
Last Verified: 7 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
124148
Wafer Sizes:
Unknown
Vintage:
2019
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
Advantest B6700L Memory Burn-In Test System, 200/208V, 3ph, 50/60Hz, 12-board capacity, WUN-B6700C racks, Hitachi HF-W2000 control computer. Mfg 2019. 76in x 80in x 78in HConfiguration
No ConfigurationOEM Model Description
B6700L has the same resources as the B6700D while accommodating a wider temperature range. The ability to perform temperature-controlled testing from -40° C to +150° C in one-tenth of a degree increments makes this system well suited for reliability and automotive-device testing. The B6700L also can simultaneously test up to 12 B6700D-compatible burn-in boards (BIB) and test programs.Documents
No documents