Advantest offers solutions for a wide variety of semiconductors and test needs, from SoC and memory, to R&D evaluation and system level test.

The ADVANTEST T5377 is a multi-functional test system designed for memory semiconductors, aimed at reducing testing costs for semiconductor manufacturers. It serves both front-end testing of DRAM semiconductors and back-end testing of flash memory semiconductors. With the capability to test up to 256 devices simultaneously, the T5377 significantly improves testing efficiency. The T5377 offers double the throughput capabilities of its predecessor, the T5371, resulting in higher production rates and decreased testing costs for customers. It optimizes its memory repair analytical structure to align with a user's memory repair algorithm, making it well-suited for semiconductor manufacturing facilities that utilize 300-millimeter wafers.

ADVANTEST

T5377

T5585

T5371

The ADVANTEST T2000 is a highly versatile test platform with a module architecture, allowing flexible reconfiguration for different applications. It offers a wide range of functional modules, including digital, high-performance analog, power-mixed signals, and image capture, enabling comprehensive test coverage at an optimal cost. The T2000's scalability spans from a 9-slot air cooling system to a 52-slot liquid cooling system with up to 8,192 channels. Advantest offers compact solutions for reduced initial investment in development and small lot productions, as well as high-efficiency multiple-DUT parallel measurement solutions for mass productions. The T2000 quickly adapts to market needs with minimal capital investment, making it a preferred choice in the semiconductor industry.

T2000

The ADVANTEST T5588, or T5588 System on Chip (SoC) Tester, is a state-of-the-art semiconductor testing equipment from Advantest Corporation. This advanced system is tailored to conduct thorough testing and verification of integrated circuits (ICs) and SoCs throughout the manufacturing process. With its cutting-edge capabilities, the T5588 ensures high precision and efficiency in semiconductor testing, making it a valuable tool for semiconductor manufacturers seeking top-level performance and reliability.

T5588

The ADVANTEST T5375 is a multi-functional test system designed for memory semiconductors, offering cost-saving benefits for semiconductor manufacturers. It is utilized for both front-end testing of DRAM semiconductors and back-end testing of flash memory semiconductors. With the ability to test up to 256 devices simultaneously, the T5375 provides efficient and high-throughput testing. The T5375 is specifically focused on capturing an increased market share in front-end DRAM semiconductor testing

T5375

The ADVANTEST T5593 is a specialized test system designed for memory semiconductors, specifically targeting high-speed SRAM, DDR-SRAM, DDR2-SDRAM, DDR3-SDRAM, SGRAM, and DRAM markets. SRAM, which stands for static random access memory, is a type of semiconductor memory that does not require refreshing while powered on, unlike DRAM. SGRAM, or synchronous graphics random access memory, is used for graphics applications. The T5593 is optimized for designing and manufacturing super high-speed memory devices. It offers the capability to simultaneously test up to 256 DDR2-SDRAM devices, providing efficient and reliable testing for these memory types. 

 T5593

The ADVANTEST T2000 LS is a highly versatile test platform with a modular architecture, allowing flexible reconfiguration based on the application's requirements. It offers a diverse range of functional modules, including digital, high-performance analog, power-mixed signals, and image capture, ensuring extensive test coverage at an optimal cost. The T2000 LS can be scaled from a 9-slot air cooling system to a 52-slot liquid cooling system with up to 8,192 channels, catering to various testing needs in the semiconductor industry.

T2000 LS

D3186 is a high-performance pulse pattern generator to generate 7 types of pseudo-random (PRBS) patterns from 2(7)-1 to 2(31) -1, programmable (WORD) patterns up to SM 2(23) bits, or frame patterns of SDH or SONET structure at very high speed from 150 Mb/s to 12 Gb/s. Moreover, a system, which is used to evaluate the bit error rate of super-high speed optical communication devices and compound semiconductors, can be structured by combining D3186 with the D3286 error detector.

D3186

Advantest‘s new T5592 Memory Test System for use in the mass production of Direct Rambus DRAM (D-RDRAM). The T5592 is capable of testing up to 64 devices in parallel and has a testing speed of 1.066 GHz.

T5592

The ADVANTEST T5377S is a versatile memory test system capable of efficiently and cost-effectively testing a wide range of memory types. This system can handle both traditional and high-speed memory interfaces, making it suitable for various memory testing requirements. With its advanced features and capabilities, the T5377S ensures reliable and accurate testing, optimizing the testing process for memory devices while keeping costs under control.

T5377S

The T2000 EPP system enables module splitting, in which one module can test multiple devices concurrently. Each device under test (DUT) can be monitored and assessed independently.

T2000 EPP

T5581H

T6535

The ADVANTEST T5503HS is an advanced semiconductor testing system developed by Advantest Corporation. This system is specifically designed to offer comprehensive testing and verification of high-speed digital and mixed-signal semiconductor devices throughout the manufacturing process. Its sophisticated capabilities ensure precise and reliable testing, making it an essential tool for semiconductor manufacturers seeking top-level performance and quality assurance.

T5503HS

The ADVANTEST T6372 is a test system specifically developed for non-memory semiconductors used in high-definition LCD displays. It enables simultaneous testing of multiple semiconductors for LCD driver integrated circuits, accommodating a total of up to 1,536 pins. 

T6372

D3286

The top-of-the-line device in the T5500 series is the T5501, a memory semiconductor test system most suitable for testing and production of ultra high-speed memory semiconductor such as the next generation SGRAM. This model allows twice as much spectrum band to be covered in terms of testing speed as the T5593 and thus enhances the measurement accuracy.

T5501

T5335P

T5365P

MPT3000ENV

T3347A

B6700DES incorporates all capabilities of B6700D into a smaller configuration for engineering purpose. It contributes to a reduced TAT (turn around time) from R&D to device production.

B6700DES

T5832

T5771

T5581P

HIFIX

T5335

The T6673 is designed to reduce total test costs associated with the production of SoC semiconductors. The T6673 is designed to test SiC semiconductors incorporated into high-speed communication network equipment and wireless handsets, digital consumer products and other electronic systems. The T6673 can test semiconductor chips with a maximum pin count 1,024, thus matching the trend of SoC semiconductors with increasing pin counts. The T6673 is capable of both front- and back-end testing of SoC semiconductors.

T6673

The ADVANTEST T5833 is a cost-efficient, high-volume test solution capable of conducting wafer sort and final test for DRAM and NAND flash memory devices. With the increasing demand for faster and higher-capacity memory devices in mobile electronics, smart phones, tablets, internet, and cloud servers, chipmakers face challenges in testing a wide array of memory devices while maintaining high functionality and performance at a low cost of test (COT). The T5833 addresses these needs by offering both wafer sort and final test capabilities for a full range of memory devices, including LPDDR3-DRAMs, high-speed NAND flash memories, and next-generation non-volatile memory ICs.

T5833

The T5383, which is capable of simultaneously testing up to 384 devices and has the same footprint as the T5377S with the capacity to test up to 50% more devices at one time, is a test system with a maximum testing rate is 286 MHz/572 Mbps, which is twice the testing rate for Advantest's previous model.

T5383

B6700S system offers a dramatically lower-cost test solution for NAND flash memories while offering the same capabilities as its sister systems. The B6700S offers a unitized function of the B6700D and can be embedded within a multi-wafer probing system used in individual wafer-level testing, avoiding any costs associated with occupying floor space in lab or production environments.

B6700S

T6371

The ADVANTEST T2000 IPS (Integrated Power Device Test Solution) is an advanced testing system specifically designed for automotive and power management applications. With its high-performance and high-throughput capabilities, the T2000 IPS efficiently tests various devices used in these industries. This comprehensive solution offers a wide range of feature-rich capabilities, ensuring precise and reliable testing of automotive and power management components. Moreover, the T2000 IPS plays a crucial role in reducing test costs by increasing throughput without compromising on the quality of testing results.

T2000 IPS

The T6577 test systems for SoC semiconductors in the T6500 series are primarily designed to test MCU and SoC semiconductors that control digital consumer products at the production lines. The T6500 series is approximately one-third in size, and uses approximately 50% less power, as compared to Advantest's predecessor product line. Further, the T6500 series operates on a software that is compatible with T6600 series.

T6577

T6672

T5334

T 5771ES

T5372

T8571A	

B6700L has the same resources as the B6700D while accommodating a wider temperature range. The ability to perform temperature-controlled testing from -40° C to +150° C in one-tenth of a degree increments makes this system well suited for reliability and automotive-device testing. The B6700L also can simultaneously test up to 12 B6700D-compatible burn-in boards (BIB) and test programs.

B6700L

Advantest’s T5773 is a package test system for NAND flash memory that supports high-speed interfaces for SSDs, handsets and other applications, meeting the test needs of new device types that demand as much as 4X the test speed of previous generations. The T5773’s operating frequency range is 200MHz / 400Mbps and offers a typical parallel test capacity of 768 DUTs. Additionally, the T5773’s innovative design achieves significant power and floorspace savings, helping to lower customer test costs dramatically. Advantest also offers a compatible T5773ES, an engineering system for R&D use.

T5773

T5571P

B6700D uses a high-capacity power supply that delivers a maximum of 256 amps per burn-in board - twice that of the first-generation B6700 tester. In addition, it has twice the driver pin resources as its predecessor, enabling it to reach higher testing frequencies and efficiency. It can also maintain or increase parallelism to keep throughput high as the number of stacked NAND die per package increases in the future. Additionally, the B6700D's oven can replicate operating conditions while controlling temperature in 0.1 ℃ increments.

B6700D

T5365

The T8571 is a test system for non memory semiconductors that is primarily used to evaluate and analyze CCDs that are image sensors. These semiconductors are used in digital consumer products, such as high-resolution digital cameras, mobile phone handset cameras and digital video cameras.

T8571

T5376

T5781 Engineering Station (T5781ES), which is designed for evaluation of devices and development of test programs in a developmental / laboratory environment. 

T5781ES

T5336

T6573

As the SSD market continues to grow, device manufacturers need a low-cost way to test their expanding product portfolios. The MPT3000HVM and MPT3000HVM2 testers provide broad capabilities to handle virtually any SSD, from the highest performing enterprise drives to the most cost-effective client devices. This unmatched functionality presents a major advantage in the rapidly changing SSD market.

MPT3000HVM

The T5586 Memory Test System enables high throughput testing of DDR SDRAMs.

T5586

T5382

ADVANTEST’s T5385 memory test system for DRAM wafer test delivers an unrivaled 768-DUT parallel test capacity and 533 Mbps capability for increased throughput and lowered cost of test.  Ideal for high-volume wafer fabs, the new tester is equipped with a flexible pin configuration that supports diverse DRAM devices, allowing tester pin resources to be optimally allocated for efficiency, reduced touchdowns and improved throughput. Achieving improved efficiency per device while scaling even higher in parallelism, the T5385 also delivers Known Good Die (KGD) for consumer devices, to greatly improve yields for LPDDR2 and DDR3 multi-die and stacked devices.

T5385

The ADVANTEST T6373 is an advanced test system featuring a high-speed and precision digitizer along with a DC (LCD ch) test unit configured for per-pin operation. This tester is specifically designed for testing many-pin and precision (10 bit/1024 gradation) driver ICs. Compared to its predecessor, the T6373 achieves an impressive throughput increase of up to 150%. 

T6373

This close cooperation between engineers from Japan and the U.S. is to thank for the success of the Japan and U.S. tester development teams in making it possible for Advantest to ship the T5831ES system designed for next-generation NAND flash memory R&D applications in April 2013, as initially planned.

T5831ES

Advantest’s new T2000 AiR offers broad test coverage for these diverse modules and system-in- package (SiP) devices.  With its modular architecture providing maximum flexibility, the tester can be configured with up to six discrete air-cooled measurement modules. This enables single-system test coverage for a wide array of highly integrated, multi-functional devices. Designed to perform digital functions and SCAN testing over as many as 512 channels in parallel, the system can test high-voltage devices up to 2,000 volts, high-precision DC converters, automotive DC devices, mixed-signal ICs with bandwidths up to 100 MHz, RF communication chips and CMOS image sensors.

T2000 AiR

T6575

T6372L

With a maximum test speed of 8Gbps, the T5511 is the world's fastest memory testers, supporting the very fastest GDDR5-SDRAM devices with capacity to spare. Furthermore, since all the system's test pins support 8Gbps, no reduction in parallelism occurs when operating at high speed.

T5511

T5381A

T5581D

T5332P

Using the same high-performance electronics and powerful software as all products in the MPT3000 family, the MPT3000ES and MPT3000ES2 engineering stations feature a small footprint configured to test up to eight SSDs in parallel. The system's small size and ability to plug into a standard AC outlet enable users to conduct program development and interactive device debugging in either office or lab settings.

MPT3000ES

T5362

T 3325

T2000 ISS

T5382A

The ADVANTEST T5503 is the flagship model in the T5500 series, specifically designed for testing and production of ultra high-speed memory semiconductors, including DDR3-SDRAM. This advanced system provides twice the testing speed coverage of the T5501, resulting in enhanced measurement accuracy.

T5503

T5378

The T5385ES Memory Test System for DRAM Development Designed for engineering use, the smaller T5385ES offers all the functional and performance qualities of the T5385. Device engineering and characterization can easily be performed, and test programs developed on the T5385ES can be seamlessly transferred to the T5385, accelerating the DRAM development processes.

T5385ES

The T6362 and T6372 are test systems for non memory semiconductors for semiconductors used with high-definition LCD displays. This system can simultaneously test multiple semiconductors for LCD driver integrated circuits with a total of up to 1,536 pins.

T6362

T3347B

Transform your burn-in testing strategy with the ATS 5030 Burn-in Test (BiT) Platform. The next-generation semiconductor tester offers independent per-site burn-in for semiconductor packaged devices. Deployed globally, the ATS 5030 BiT Platform is a turnkey system that consistently delivers industry-leading thermal stress test for billions of semiconductor devices.

ATS 5030

T3347P

A new multifunctional memory test system that provides high-speed memory test coverage for diverse next-generation memory chips. The T5835 achieves massive parallelism and test speeds more than double those of previous products, meeting the testing needs of next-generation memory devices with increased speed and capacity.

T5835

The T5761 covers the full range of testing, from NAND-type flash memory testing to package testing. The T5761 is capable of simultaneous testing up to 512 devices, which is twice the capability of Advantest's previous model, and allow for lower testing costs through its improved ability to detect failures. 

T5761

T6575A

T 53P

T5581

T6671E

T5591

T5591R

T5723ES

T5363P

P2000

ADCE 8250A

T5331P

T5723

Advantest commercialized the T5831 for NAND-type flash memories. 

T5831

B6700 can test as many as 48 burn-in boards in parallel at speeds up to 10 MHz, which helps memory suppliers get their newest products to market faster while also reducing testing costs. An original high performance chamber improves yield by assuring high temperature accuracy while generating high temperature. It also shortens the temperature rise and fall time which leads to shortening the test time.

B6700

The T7721 and T7722 are test systems for non memory semiconductors for mixed signal integrated circuits. 

T7722

T7315

T5587

T5311

Memory Test System
The T5851 system is designed to provide a cost-effective test solution for evaluating high-speed protocol NAND flash memories including UFS3.0 universal flash storage and PCIe Gen 4 NVMe solid-state drives (SSD), both of which are expected to be in high demand for the LTE 5G communications market.

T5851ES

B6700ES incorporates all capabilities of the B6700. It contributes to a reduced TAT (turn around time) from R&D to device production.

ADVANTEST

Overview

Active Listings

Total Products

Services

Top ADVANTEST Final Test

T5377

T5371

T5585

T2000

List it with Moov and find the perfect buyer in no time at all.

All ADVANTEST Final Test