Advantest offers solutions for a wide variety of semiconductors and test needs, from SoC and memory, to R&D evaluation and system level test.

ADVANTEST

T5371

Manufacturer: Advantest
Model: T5371
Type: Test system (With a single test head )
Version: Test
Condition: excellent
Sale condition: as is where is
Quantity: 1
Comments:
The ADVANTEST T5371 is a general-purpose and high-performance memory test system. This test system is engineered to meet various requirements for designing and characterizing the new generation of VLSI memories.
This test system can be used to test and characterize general-purpose memories such as DRAM, SRAM, EPROM and mask ROM, and flash memories.
T5371 contains the flash memory simultaneous measurement function as an optional function.

-Can be used for testing DRAM , SRAM or Flash memory

-Testing of defective blocks on a block-by-block basis

-Independent control of the mask feature on every DUT

ADVANTEST --- T5371.pdf

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Hardware Composition

System-
PPS Advantest BGR-022363 (8)
DC: Advantest BGR-024701 (2)
ALPG: Advantest BGR-024409 (1)
FMRA: Advantest BIR-024413 (4)
MCPU: Advantest WBL-023086 (1)
RCPU: Advantest WBL-023084 (8)

HEAD 1-
PE Board Advantest BGM-023206X04 (44)

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ADVANTEST T5371 MEMORY TEST SYSTEM(CP) (DUAL TEST HEAD)

ADVANTEST T5371 MEMORY TEST SYSTEM (DUAL HEAD) (53)

T5371

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