Skip to main content
We value your privacy

We and our selected partners use cookies to enhance your browsing experience, serve personalized content, and analyze our traffic. By clicking "Accept All", you consent to our use of cookies. Read More

Moov logo

Moov Icon
ADVANTEST B6700D
  • ADVANTEST B6700D
  • ADVANTEST B6700D
  • ADVANTEST B6700D
  • ADVANTEST B6700D
  • ADVANTEST B6700D
  • ADVANTEST B6700D
  • ADVANTEST B6700D
  • ADVANTEST B6700D
Description
No description
Configuration
Two of the cooling systems and two of the oven units that has 2 ovens each.
OEM Model Description
B6700D uses a high-capacity power supply that delivers a maximum of 256 amps per burn-in board - twice that of the first-generation B6700 tester. In addition, it has twice the driver pin resources as its predecessor, enabling it to reach higher testing frequencies and efficiency. It can also maintain or increase parallelism to keep throughput high as the number of stacked NAND die per package increases in the future. Additionally, the B6700D's oven can replicate operating conditions while controlling temperature in 0.1 ℃ increments.
Documents

No documents

CATEGORY
Final Test

Last Verified: Over 60 days ago

Key Item Details

Condition:

New


Operational Status:

Unknown


Product ID:

96442


Wafer Sizes:

Unknown


Vintage:

Unknown


Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available

ADVANTEST

B6700D

verified-listing-icon
Verified
CATEGORY
Final Test
Last Verified: Over 60 days ago
listing-photo-873cd75fecde4aef9fd6f5a312d9ed77-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/76660/873cd75fecde4aef9fd6f5a312d9ed77/06367acbb404403db246c806d03dc6c6_9ed0c8c1a2a14110b8b05101d8978ace1201a_mw.jpeg
listing-photo-873cd75fecde4aef9fd6f5a312d9ed77-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/76660/873cd75fecde4aef9fd6f5a312d9ed77/be090f50904a46c4988e9464eb32f771_447d2d54a85a4432a70cac1f5e0553d1_mw.jpeg
listing-photo-873cd75fecde4aef9fd6f5a312d9ed77-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/76660/873cd75fecde4aef9fd6f5a312d9ed77/b4600632ad8e489ca0164b3bb17d4e1b_ab130d6177be4711804fe6fb2210cfdf_mw.jpeg
listing-photo-873cd75fecde4aef9fd6f5a312d9ed77-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/76660/873cd75fecde4aef9fd6f5a312d9ed77/a2bdfff5a7264a1a8fe66f0c6cc1443a_763848bdda2c4b349460900b87a8f77f1201a_mw.jpeg
listing-photo-873cd75fecde4aef9fd6f5a312d9ed77-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/76660/873cd75fecde4aef9fd6f5a312d9ed77/737482de81734038a9f7769fd05202cb_eec9398374d34938979c3483b57a737f_mw.jpeg
listing-photo-873cd75fecde4aef9fd6f5a312d9ed77-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/76660/873cd75fecde4aef9fd6f5a312d9ed77/4e0b044afd48479ca5ad329182bcdbe8_9adde2a105ab4d99856ec5722f9e2008_mw.jpeg
listing-photo-873cd75fecde4aef9fd6f5a312d9ed77-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/76660/873cd75fecde4aef9fd6f5a312d9ed77/7a1823a9f2a24967951997a459924b54_054c8aa8512b43809aaee9d90b58ed0b_mw.jpeg
listing-photo-873cd75fecde4aef9fd6f5a312d9ed77-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/76660/873cd75fecde4aef9fd6f5a312d9ed77/bf3920644ffb447597a50a8b4c86a836_6b7927950a674e84b83030ce8ea1426d1201a_mw.jpeg
Key Item Details

Condition:

New


Operational Status:

Unknown


Product ID:

96442


Wafer Sizes:

Unknown


Vintage:

Unknown


Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
No description
Configuration
Two of the cooling systems and two of the oven units that has 2 ovens each.
OEM Model Description
B6700D uses a high-capacity power supply that delivers a maximum of 256 amps per burn-in board - twice that of the first-generation B6700 tester. In addition, it has twice the driver pin resources as its predecessor, enabling it to reach higher testing frequencies and efficiency. It can also maintain or increase parallelism to keep throughput high as the number of stacked NAND die per package increases in the future. Additionally, the B6700D's oven can replicate operating conditions while controlling temperature in 0.1 ℃ increments.
Documents

No documents