Description
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[PROPERTY) Version = 2.00 [SYSTEM INFORMATION) ProductType- T5833 PowerFrequency = 60 PStype THtype = OSTH MBtype - NORMAL SYS-Ctype = STANDARD RCPUcount = 0 EMfunction = STANDARD FmEcc = DISABLE FmHSFbmap = DISABLEOEM Model Description
The ADVANTEST T5833 is a cost-efficient, high-volume test solution capable of conducting wafer sort and final test for DRAM and NAND flash memory devices. With the increasing demand for faster and higher-capacity memory devices in mobile electronics, smart phones, tablets, internet, and cloud servers, chipmakers face challenges in testing a wide array of memory devices while maintaining high functionality and performance at a low cost of test (COT). The T5833 addresses these needs by offering both wafer sort and final test capabilities for a full range of memory devices, including LPDDR3-DRAMs, high-speed NAND flash memories, and next-generation non-volatile memory ICs.Documents
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ADVANTEST
T5833
Verified
CATEGORY
Final Test
Last Verified: Over 30 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
102899
Wafer Sizes:
Unknown
Vintage:
2019
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
ADVANTEST
T5833
CATEGORY
Final Test
Last Verified: Over 30 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
102899
Wafer Sizes:
Unknown
Vintage:
2019
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
No descriptionConfiguration
[PROPERTY) Version = 2.00 [SYSTEM INFORMATION) ProductType- T5833 PowerFrequency = 60 PStype THtype = OSTH MBtype - NORMAL SYS-Ctype = STANDARD RCPUcount = 0 EMfunction = STANDARD FmEcc = DISABLE FmHSFbmap = DISABLEOEM Model Description
The ADVANTEST T5833 is a cost-efficient, high-volume test solution capable of conducting wafer sort and final test for DRAM and NAND flash memory devices. With the increasing demand for faster and higher-capacity memory devices in mobile electronics, smart phones, tablets, internet, and cloud servers, chipmakers face challenges in testing a wide array of memory devices while maintaining high functionality and performance at a low cost of test (COT). The T5833 addresses these needs by offering both wafer sort and final test capabilities for a full range of memory devices, including LPDDR3-DRAMs, high-speed NAND flash memories, and next-generation non-volatile memory ICs.Documents
No documents