We value your privacy
We and our selected partners use cookies to enhance your browsing experience, serve personalized content, and analyze our traffic. By clicking "Accept All", you consent to our use of cookies. Read More
Description
Memory TesterConfiguration
No ConfigurationOEM Model Description
The ADVANTEST T5588, or T5588 System on Chip (SoC) Tester, is a state-of-the-art semiconductor testing equipment from Advantest Corporation. This advanced system is tailored to conduct thorough testing and verification of integrated circuits (ICs) and SoCs throughout the manufacturing process. With its cutting-edge capabilities, the T5588 ensures high precision and efficiency in semiconductor testing, making it a valuable tool for semiconductor manufacturers seeking top-level performance and reliability.Documents
No documents
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
99732
Wafer Sizes:
Unknown
Vintage:
Unknown
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Similar Listings
View All
ADVANTEST
T5588
CATEGORY
Final Test
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
99732
Wafer Sizes:
Unknown
Vintage:
Unknown
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
Memory TesterConfiguration
No ConfigurationOEM Model Description
The ADVANTEST T5588, or T5588 System on Chip (SoC) Tester, is a state-of-the-art semiconductor testing equipment from Advantest Corporation. This advanced system is tailored to conduct thorough testing and verification of integrated circuits (ICs) and SoCs throughout the manufacturing process. With its cutting-edge capabilities, the T5588 ensures high precision and efficiency in semiconductor testing, making it a valuable tool for semiconductor manufacturers seeking top-level performance and reliability.Documents
No documents