Skip to main content
6" Fab For Sale from Moov - Click Here to Learn More
6" Fab For Sale from Moov - Click Here to Learn More
Moov logo

6" Fab For Sale from Moov - Click Here to Learn More
Moov Icon
ADVANTEST T5377
    Description
    No description
    Configuration
    No Configuration
    OEM Model Description
    The ADVANTEST T5377 is a multi-functional test system designed for memory semiconductors, aimed at reducing testing costs for semiconductor manufacturers. It serves both front-end testing of DRAM semiconductors and back-end testing of flash memory semiconductors. With the capability to test up to 256 devices simultaneously, the T5377 significantly improves testing efficiency. The T5377 offers double the throughput capabilities of its predecessor, the T5371, resulting in higher production rates and decreased testing costs for customers. It optimizes its memory repair analytical structure to align with a user's memory repair algorithm, making it well-suited for semiconductor manufacturing facilities that utilize 300-millimeter wafers.
    Documents

    No documents

    ADVANTEST

    T5377

    verified-listing-icon

    Verified

    CATEGORY
    Final Test

    Last Verified: Over 60 days ago

    Key Item Details

    Condition:

    Used


    Operational Status:

    Unknown


    Product ID:

    24126


    Wafer Sizes:

    Unknown


    Vintage:

    2009


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Similar Listings
    View All
    ADVANTEST T5377

    ADVANTEST

    T5377

    Final Test
    Vintage: 2003Condition: Used
    Last VerifiedOver 60 days ago

    ADVANTEST

    T5377

    verified-listing-icon
    Verified
    CATEGORY
    Final Test
    Last Verified: Over 60 days ago
    listing-photo-c29321a2beec4524816a6a45523f9bcc-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1160/c29321a2beec4524816a6a45523f9bcc/1bf1b9c9f2e84327a5a4cb2fa721d647_finaltestadvantestt5377_f.jpeg
    Key Item Details

    Condition:

    Used


    Operational Status:

    Unknown


    Product ID:

    24126


    Wafer Sizes:

    Unknown


    Vintage:

    2009


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Description
    No description
    Configuration
    No Configuration
    OEM Model Description
    The ADVANTEST T5377 is a multi-functional test system designed for memory semiconductors, aimed at reducing testing costs for semiconductor manufacturers. It serves both front-end testing of DRAM semiconductors and back-end testing of flash memory semiconductors. With the capability to test up to 256 devices simultaneously, the T5377 significantly improves testing efficiency. The T5377 offers double the throughput capabilities of its predecessor, the T5371, resulting in higher production rates and decreased testing costs for customers. It optimizes its memory repair analytical structure to align with a user's memory repair algorithm, making it well-suited for semiconductor manufacturing facilities that utilize 300-millimeter wafers.
    Documents

    No documents

    Similar Listings
    View All
    ADVANTEST T5377

    ADVANTEST

    T5377

    Final TestVintage: 2003Condition: UsedLast Verified:Over 60 days ago
    ADVANTEST T5377

    ADVANTEST

    T5377

    Final TestVintage: 2009Condition: UsedLast Verified:Over 60 days ago
    ADVANTEST T5377

    ADVANTEST

    T5377

    Final TestVintage: 2003Condition: UsedLast Verified:Over 60 days ago