
Description
Included in the package: Full test head and channel cards Support rack / mainframe Reid-Ashman SX Manipulator Cooling unit with hoses HP Z620 WorkstationConfiguration
Test Head: STH Digital Boards: PS400A x12, PS400B x1 DPS Boards: DCS-DPS32 x4, DCS-UHC4 x2, HCDPS x2 Infrastructure Boards: Clock x4, Computer Interface x1, Active Control x2, Passive Control x2, Wiring x1, Power Control x4, Backplane x4, Frontplane x4, DCDC x16, RACK Interface x1, ACDC x3OEM Model Description
The Agilent 93000, also known as VERIGY 93000, is a versatile and scalable system-on-a-chip (SOC) testing platform. It serves as a single solution with flexible upgradeability, covering a wide range of applications, including digital, analog, and embedded memory testing.Documents
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Verified
CATEGORY
Final Test
Last Verified: Yesterday
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
145053
Wafer Sizes:
Unknown
Vintage:
Unknown
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
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View AllADVANTEST / VERIGY
93000
CATEGORY
Final Test
Last Verified: Yesterday
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
145053
Wafer Sizes:
Unknown
Vintage:
Unknown
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
Included in the package: Full test head and channel cards Support rack / mainframe Reid-Ashman SX Manipulator Cooling unit with hoses HP Z620 WorkstationConfiguration
Test Head: STH Digital Boards: PS400A x12, PS400B x1 DPS Boards: DCS-DPS32 x4, DCS-UHC4 x2, HCDPS x2 Infrastructure Boards: Clock x4, Computer Interface x1, Active Control x2, Passive Control x2, Wiring x1, Power Control x4, Backplane x4, Frontplane x4, DCDC x16, RACK Interface x1, ACDC x3OEM Model Description
The Agilent 93000, also known as VERIGY 93000, is a versatile and scalable system-on-a-chip (SOC) testing platform. It serves as a single solution with flexible upgradeability, covering a wide range of applications, including digital, analog, and embedded memory testing.Documents
No documents