Description
Spectroscopic Ellipsometer SENresearch 4.0 SER 850 DUVConfiguration
Item p/n Description SER 850 DUV SENresearch 4.0 SER 850 DUV SER 16 Mapping accessories for the SENresearch 4.0 ellipsometer with 200 mm x-y sample stage SER 800-3 Microspot optics SER 800-30 Reflectometer measurement accessory for the SENresearch 4.0 ellipsometer Spectral range: 400 nm – 1000 nm SER AFT Automatic sample alignment in height and tilt using a height-adjustable sample platform SER 850-NIRE Extension of the spectral range in the NIR to a spectral range of 190 nm – 3500 nm. -Incl. Vibration-damped table 85x85cm Newport < 500 measurmentsOEM Model Description
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Verified
CATEGORY
Elipsometry
Last Verified: 5 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
145848
Wafer Sizes:
Unknown
Vintage:
2023
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
SENTECH
SENresearch 4.0
CATEGORY
Elipsometry
Last Verified: 5 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
145848
Wafer Sizes:
Unknown
Vintage:
2023
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
Spectroscopic Ellipsometer SENresearch 4.0 SER 850 DUVConfiguration
Item p/n Description SER 850 DUV SENresearch 4.0 SER 850 DUV SER 16 Mapping accessories for the SENresearch 4.0 ellipsometer with 200 mm x-y sample stage SER 800-3 Microspot optics SER 800-30 Reflectometer measurement accessory for the SENresearch 4.0 ellipsometer Spectral range: 400 nm – 1000 nm SER AFT Automatic sample alignment in height and tilt using a height-adjustable sample platform SER 850-NIRE Extension of the spectral range in the NIR to a spectral range of 190 nm – 3500 nm. -Incl. Vibration-damped table 85x85cm Newport < 500 measurmentsOEM Model Description
None ProvidedDocuments
No documents