ALERIS 8350
Category
ElipsometryOverview
The Aleris 8350 is a high-performance film metrology system that meets the tighter process tolerances required for thickness, refractive index and stress measurements on critical films. The Aleris 8350 film thickness measurement system is used for advanced film development, characterization and process control for a wide range of critical films, including ultra-thin diffusion layers, ultra-thin gate oxides, advanced photoresists, 193nm ARC layers, ultra-thin multi-layer stacks, and CVD layers.
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ALERIS 8350
ElipsometryVintage: Condition: UsedLast VerifiedOver 30 days agoKLA
ALERIS 8350
ElipsometryVintage: Condition: UsedLast VerifiedOver 60 days agoKLA
ALERIS 8350
ElipsometryVintage: Condition: UsedLast VerifiedOver 60 days agoKLA
ALERIS 8350
ElipsometryVintage: Condition: UsedLast VerifiedOver 60 days ago