Description
MetrologyConfiguration
FM8OEM Model Description
Measuring constants: Film thickness, n, k vs λ Thickness range: sub Å ~ 10 μm (depends on film type) Wavelength range: 220 ~ 850 nm (uv) or 380 ~ 1050 nm Option of Spectral Range - (Duv:193nm, IR: 900nm ~ 1700nm, 900nm~ 2,200nm)Documents
No documents
Ellipso Technology
Elli-SE
Verified
CATEGORY
Elipsometry
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
101323
Wafer Sizes:
8"/200mm
Vintage:
Unknown
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Ellipso Technology
Elli-SE
CATEGORY
Elipsometry
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
101323
Wafer Sizes:
8"/200mm
Vintage:
Unknown
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
MetrologyConfiguration
FM8OEM Model Description
Measuring constants: Film thickness, n, k vs λ Thickness range: sub Å ~ 10 μm (depends on film type) Wavelength range: 220 ~ 850 nm (uv) or 380 ~ 1050 nm Option of Spectral Range - (Duv:193nm, IR: 900nm ~ 1700nm, 900nm~ 2,200nm)Documents
No documents