Description
Automatic optical Inspection machine to check probe scratchesConfiguration
No ConfigurationOEM Model Description
STI’s iFocus is a highly intelligent precision wafer inspection system that offers a comprehensive solution for the inspection of frame and/or whole wafer. Using STI’s proprietary On-The-Fly (OTF™) vision, the iFocus can be configured to detect any type of micro defects arising from wafer processing, post dicing or packing. The OTF™ optical system encompasses pioneering technology in areas such as optics and illumination design, 2D, 3D and active die inspection algorithms. Patented Simultaneous Dual Illumination Image Capture Technology is used to eliminate escape and reduce overkill without compromising throughput.Documents
No documents
STI
IFOCUS
Verified
CATEGORY
Defect Inspection
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Installed / Running
Product ID:
91380
Wafer Sizes:
Unknown
Vintage:
2017
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
STI
IFOCUS
CATEGORY
Defect Inspection
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Installed / Running
Product ID:
91380
Wafer Sizes:
Unknown
Vintage:
2017
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
Automatic optical Inspection machine to check probe scratchesConfiguration
No ConfigurationOEM Model Description
STI’s iFocus is a highly intelligent precision wafer inspection system that offers a comprehensive solution for the inspection of frame and/or whole wafer. Using STI’s proprietary On-The-Fly (OTF™) vision, the iFocus can be configured to detect any type of micro defects arising from wafer processing, post dicing or packing. The OTF™ optical system encompasses pioneering technology in areas such as optics and illumination design, 2D, 3D and active die inspection algorithms. Patented Simultaneous Dual Illumination Image Capture Technology is used to eliminate escape and reduce overkill without compromising throughput.Documents
No documents