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ONTO / RUDOLPH / AUGUST NSX-220
    Description
    No description
    Configuration
    No Configuration
    OEM Model Description
    The NSX® 220 System is an automated macro defect inspection system designed for semiconductor, LED, and MEMS manufacturers. It offers cost-effective back-end macro defect inspection for wafers up to 300mm in size. The system uses gray-scale image analysis to provide fast, accurate inspection and metrology. It can detect traditional advanced macro defects and perform two-dimensional measurements on bumps, probe marks, and edge trim processes. The system features a flexible objective turret, a programmable light tower, a standard docking module, recipe sharing, and a 2D defect and metrology verification standard. It is ideal for manufacturers looking to optimize productivity and minimize the need for operator assistance.
    Documents

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    ONTO / RUDOLPH / AUGUST

    NSX-220

    verified-listing-icon

    Verified

    CATEGORY
    Defect Inspection

    Last Verified: 10 days ago

    Key Item Details
    Condition:

    Used

    Operational Status:

    Unknown

    Product ID:

    141848

    Wafer Sizes:

    6"/150mm

    Vintage:

    Unknown

    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Similar Listings
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    ONTO / RUDOLPH / AUGUST NSX-220

    ONTO / RUDOLPH / AUGUST

    NSX-220

    Defect Inspection
    Vintage: 0Condition: Used
    Last Verified10 days ago

    ONTO / RUDOLPH / AUGUST

    NSX-220

    verified-listing-icon
    Verified
    CATEGORY
    Defect Inspection
    Last Verified: 10 days ago
    listing-photo-9deba6f0838e4ab3b31e093ff5c15703-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    Key Item Details
    Condition:

    Used

    Operational Status:

    Unknown

    Product ID:

    141848

    Wafer Sizes:

    6"/150mm

    Vintage:

    Unknown

    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Description
    No description
    Configuration
    No Configuration
    OEM Model Description
    The NSX® 220 System is an automated macro defect inspection system designed for semiconductor, LED, and MEMS manufacturers. It offers cost-effective back-end macro defect inspection for wafers up to 300mm in size. The system uses gray-scale image analysis to provide fast, accurate inspection and metrology. It can detect traditional advanced macro defects and perform two-dimensional measurements on bumps, probe marks, and edge trim processes. The system features a flexible objective turret, a programmable light tower, a standard docking module, recipe sharing, and a 2D defect and metrology verification standard. It is ideal for manufacturers looking to optimize productivity and minimize the need for operator assistance.
    Documents

    No documents

    Similar Listings
    View All
    ONTO / RUDOLPH / AUGUST NSX-220

    ONTO / RUDOLPH / AUGUST

    NSX-220

    Defect InspectionVintage: 0Condition: UsedLast Verified:10 days ago