Description
Metrology Shutdown in the year 2024Configuration
No ConfigurationOEM Model Description
The INS3300 automated optical defect review and defect classification system incorporates UV and DUV optics for the highest resolution available on any optical review microscope. Fully automated and production-ready, the INS3300 defect classification system is user-friendly, ergonomic and reliable.Documents
No documents
Verified
CATEGORY
Defect Inspection
Last Verified: Today
Key Item Details
Condition:
Used
Operational Status:
Deinstalled
Product ID:
117836
Wafer Sizes:
12"/300mm
Vintage:
2002
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
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KLA / VISTEC / LEICA
INS3300
CATEGORY
Defect Inspection
Last Verified: Today
Key Item Details
Condition:
Used
Operational Status:
Deinstalled
Product ID:
117836
Wafer Sizes:
12"/300mm
Vintage:
2002
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
Metrology Shutdown in the year 2024Configuration
No ConfigurationOEM Model Description
The INS3300 automated optical defect review and defect classification system incorporates UV and DUV optics for the highest resolution available on any optical review microscope. Fully automated and production-ready, the INS3300 defect classification system is user-friendly, ergonomic and reliable.Documents
No documents