Description
Wafer Handling System for a Leica INS 2000 Defect Review System No Microscope is Included Cassette to Cassette Wafer Handling for up to 200mm Wafers SMC Digital Pressure Sensor 120V/230V, 50/60 Hz, P Max 400 VA CE MarkedConfiguration
No ConfigurationOEM Model Description
None ProvidedDocuments
No documents
KLA / VISTEC / LEICA
INS2000
Verified
CATEGORY
Defect Inspection
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
14788
Wafer Sizes:
8"/200mm
Vintage:
1996
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
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KLA / VISTEC / LEICA
INS2000
CATEGORY
Defect Inspection
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
14788
Wafer Sizes:
8"/200mm
Vintage:
1996
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
Wafer Handling System for a Leica INS 2000 Defect Review System No Microscope is Included Cassette to Cassette Wafer Handling for up to 200mm Wafers SMC Digital Pressure Sensor 120V/230V, 50/60 Hz, P Max 400 VA CE MarkedConfiguration
No ConfigurationOEM Model Description
None ProvidedDocuments
No documents