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KLA CANDELA CS1
  • KLA CANDELA CS1
  • KLA CANDELA CS1
  • KLA CANDELA CS1
  • KLA CANDELA CS1
  • KLA CANDELA CS1
  • KLA CANDELA CS1
  • KLA CANDELA CS1
  • KLA CANDELA CS1
  • KLA CANDELA CS1
  • KLA CANDELA CS1
  • KLA CANDELA CS1
Description
No missing parts.
Configuration
No Configuration
OEM Model Description
The new Candela CS1 and CS2 systems address compound semiconductor wafer inspection applications, providing the unique capability to inspect both transparent and opaque wafers for detection and classification of particles and other process-related defects.
Documents

No documents

KLA

CANDELA CS1

verified-listing-icon

Verified

CATEGORY
Defect Inspection

Last Verified: Over 60 days ago

Key Item Details

Condition:

Used


Operational Status:

Unknown


Product ID:

47112


Wafer Sizes:

Unknown


Vintage:

2007


Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available

KLA

CANDELA CS1

verified-listing-icon
Verified
CATEGORY
Defect Inspection
Last Verified: Over 60 days ago
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Key Item Details

Condition:

Used


Operational Status:

Unknown


Product ID:

47112


Wafer Sizes:

Unknown


Vintage:

2007


Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
No missing parts.
Configuration
No Configuration
OEM Model Description
The new Candela CS1 and CS2 systems address compound semiconductor wafer inspection applications, providing the unique capability to inspect both transparent and opaque wafers for detection and classification of particles and other process-related defects.
Documents

No documents