Description
No missing parts.Configuration
No ConfigurationOEM Model Description
The new Candela CS1 and CS2 systems address compound semiconductor wafer inspection applications, providing the unique capability to inspect both transparent and opaque wafers for detection and classification of particles and other process-related defects.Documents
No documents
KLA
CANDELA CS1
Verified
CATEGORY
Defect Inspection
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
47112
Wafer Sizes:
Unknown
Vintage:
2007
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
KLA
CANDELA CS1
CATEGORY
Defect Inspection
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
47112
Wafer Sizes:
Unknown
Vintage:
2007
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
No missing parts.Configuration
No ConfigurationOEM Model Description
The new Candela CS1 and CS2 systems address compound semiconductor wafer inspection applications, providing the unique capability to inspect both transparent and opaque wafers for detection and classification of particles and other process-related defects.Documents
No documents