Skip to main content
Moov logo
Moov Icon
KLA 8900
    Description
    Wafer inspection system
    Configuration
    Power requirements: 208 V 50/60 Hz CE marked
    OEM Model Description
    In October 2009, KLA launched the 8900 defect inspection system, a new tool for the CMOS Image Sensor market. The 8900 is designed to enable capture of a wide variety of defect types, with adjustable sensitivity and throughput settings for cost-effective defect management from initial product development through volume production of color filter arrays.
    Documents

    No documents

    KLA

    8900

    verified-listing-icon

    Verified

    CATEGORY
    Defect Inspection

    Last Verified: 10 days ago

    Key Item Details
    Condition:

    Used

    Operational Status:

    Unknown

    Product ID:

    153416

    Wafer Sizes:

    8"/200mm, 12"/300mm

    Vintage:

    2011

    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Similar Listings
    View All
    KLA 8900

    KLA

    8900

    Defect Inspection
    Vintage: 2013Condition: Used
    Last Verified10 days ago
    KLA 8900

    KLA

    8900

    Defect Inspection
    Vintage: 2011Condition: Used
    Last Verified10 days ago

    KLA

    8900

    verified-listing-icon
    Verified
    CATEGORY
    Defect Inspection
    Last Verified: 10 days ago
    listing-photo-d225c92b3646478bb7d1bd0e83681dab-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1710/d225c92b3646478bb7d1bd0e83681dab/1f388ca40c6e4eebacd8f555dc0a6085_2710901kla8900101_mw.jpg
    listing-photo-d225c92b3646478bb7d1bd0e83681dab-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1710/d225c92b3646478bb7d1bd0e83681dab/8156ac8801e441d0a4ddc17cf9e7e317_2710902kla8900103_mw.jpg
    listing-photo-d225c92b3646478bb7d1bd0e83681dab-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1710/d225c92b3646478bb7d1bd0e83681dab/1bca9363104f479094cca1674fd0218f_2710903kla8900104_mw.jpg
    listing-photo-d225c92b3646478bb7d1bd0e83681dab-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1710/d225c92b3646478bb7d1bd0e83681dab/6bd1678826e24437999f88aabfd18d06_2710904kla8900106_mw.jpg
    listing-photo-d225c92b3646478bb7d1bd0e83681dab-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1710/d225c92b3646478bb7d1bd0e83681dab/155011b45a624637b7db485e8162f97c_2710905kla8900107_mw.jpg
    listing-photo-d225c92b3646478bb7d1bd0e83681dab-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1710/d225c92b3646478bb7d1bd0e83681dab/5c5b13d29cc944a992b87b761763c3a5_271090akla8900105_mw.jpg
    Key Item Details
    Condition:

    Used

    Operational Status:

    Unknown

    Product ID:

    153416

    Wafer Sizes:

    8"/200mm, 12"/300mm

    Vintage:

    2011

    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Description
    Wafer inspection system
    Configuration
    Power requirements: 208 V 50/60 Hz CE marked
    OEM Model Description
    In October 2009, KLA launched the 8900 defect inspection system, a new tool for the CMOS Image Sensor market. The 8900 is designed to enable capture of a wide variety of defect types, with adjustable sensitivity and throughput settings for cost-effective defect management from initial product development through volume production of color filter arrays.
    Documents

    No documents

    Similar Listings
    View All
    KLA 8900

    KLA

    8900

    Defect InspectionVintage: 2013Condition: UsedLast Verified:10 days ago
    KLA 8900

    KLA

    8900

    Defect InspectionVintage: 2011Condition: UsedLast Verified:10 days ago