Description
KLA Advanced Macro Inspection ModuleConfiguration
Macro InspectionOEM Model Description
2900 and 2905: Optical broadband plasma wafer defect inspectors that provide capture of yield-relevant defects on 2Xnm memory and logic devices.Documents
No documents
KLA
2900
CATEGORY
Defect Inspection
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
91270
Wafer Sizes:
12"/300mm
Vintage:
2011
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
KLA Advanced Macro Inspection ModuleConfiguration
Macro InspectionOEM Model Description
2900 and 2905: Optical broadband plasma wafer defect inspectors that provide capture of yield-relevant defects on 2Xnm memory and logic devices.Documents
No documents