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Description
KLA Advanced Macro Inspection ModuleConfiguration
Macro InspectionOEM Model Description
2900 and 2905: Optical broadband plasma wafer defect inspectors that provide capture of yield-relevant defects on 2Xnm memory and logic devices.Documents
No documents
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
91270
Wafer Sizes:
12"/300mm
Vintage:
2011
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
KLA
2900
CATEGORY
Defect Inspection
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
91270
Wafer Sizes:
12"/300mm
Vintage:
2011
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
KLA Advanced Macro Inspection ModuleConfiguration
Macro InspectionOEM Model Description
2900 and 2905: Optical broadband plasma wafer defect inspectors that provide capture of yield-relevant defects on 2Xnm memory and logic devices.Documents
No documents