Description
KLA Advanced Macro Inspection ModuleConfiguration
No ConfigurationOEM Model Description
2900 and 2905: Optical broadband plasma wafer defect inspectors that provide capture of yield-relevant defects on 2Xnm memory and logic devices.Documents
KLA
2900
Verified
CATEGORY
Defect Inspection
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
69546
Wafer Sizes:
12"/300mm
Vintage:
2011
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Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Similar Listings
View AllKLA
2900
Verified
CATEGORY
Defect Inspection
Last Verified: 19 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
69546
Wafer Sizes:
12"/300mm
Vintage:
2011
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available