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6" Fab For Sale from Moov - Click Here to Learn More
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KLA VisEdge CV300
    Description
    No description
    Configuration
    No Configuration
    OEM Model Description
    To help customers identify and fix these edge-related yield issues, KLA-Tencor introduced the VisEdge™ CV300, in October 2006. The tool’s unique optics design and advanced defect classification capabilities allow IC manufacturers to capture a wide range of wafer-edge defect types with high sensitivity.
    Documents

    No documents

    KLA

    VisEdge CV300

    verified-listing-icon

    Verified

    CATEGORY
    Defect Inspection

    Last Verified: Over 60 days ago

    Key Item Details
    Condition:

    Used

    Operational Status:

    Unknown

    Product ID:

    66253

    Wafer Sizes:

    12"/300mm

    Vintage:

    2007

    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Similar Listings
    View All
    KLA VisEdge CV300

    KLA

    VisEdge CV300

    Defect Inspection
    Vintage: 2007Condition: Used
    Last VerifiedOver 60 days ago

    KLA

    VisEdge CV300

    verified-listing-icon
    Verified
    CATEGORY
    Defect Inspection
    Last Verified: Over 60 days ago
    listing-photo-8efc188d84304ffda23a322b7b4a9db1-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    Key Item Details
    Condition:

    Used

    Operational Status:

    Unknown

    Product ID:

    66253

    Wafer Sizes:

    12"/300mm

    Vintage:

    2007

    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Description
    No description
    Configuration
    No Configuration
    OEM Model Description
    To help customers identify and fix these edge-related yield issues, KLA-Tencor introduced the VisEdge™ CV300, in October 2006. The tool’s unique optics design and advanced defect classification capabilities allow IC manufacturers to capture a wide range of wafer-edge defect types with high sensitivity.
    Documents

    No documents

    Similar Listings
    View All
    KLA VisEdge CV300

    KLA

    VisEdge CV300

    Defect InspectionVintage: 2007Condition: UsedLast Verified:Over 60 days ago