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KLA VIPER 2410
    Description
    No description
    Configuration
    KLA-Tencor's 2401 Automated Macro Defect Inspection System - Replacing the manual bright light macro defect inspection performed by operators. - Automated detection, classification and reporting of all yield- critical macro after-develop inspection defect types, including hotspots, scratches, large particles, extra and missing resist, unexposed fields, striations, developer spots and splashback. - With sensitivity superior to that of operators, the 2401 Automated Macro Defect Inspection System detects defects reliably and repeatably, allowing disposition decisions to be made quickly and accurately, dramatically reducing scrap and preventing further investment in low-yielding wafers.
    OEM Model Description
    None Provided
    Documents

    No documents

    KLA

    VIPER 2410

    verified-listing-icon

    Verified

    CATEGORY
    Defect Inspection

    Last Verified: Yesterday

    Key Item Details
    Condition:

    Used

    Operational Status:

    Unknown

    Product ID:

    55832

    Wafer Sizes:

    8"/200mm

    Vintage:

    2001

    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
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    listing-photo-d772f1bb23c94616b3245acea6476c0d-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1987/d772f1bb23c94616b3245acea6476c0d/d7be37d8db66487081d69c62a9eb437e_1_mw.jpg
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    Key Item Details
    Condition:

    Used

    Operational Status:

    Unknown

    Product ID:

    55832

    Wafer Sizes:

    8"/200mm

    Vintage:

    2001

    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Description
    No description
    Configuration
    KLA-Tencor's 2401 Automated Macro Defect Inspection System - Replacing the manual bright light macro defect inspection performed by operators. - Automated detection, classification and reporting of all yield- critical macro after-develop inspection defect types, including hotspots, scratches, large particles, extra and missing resist, unexposed fields, striations, developer spots and splashback. - With sensitivity superior to that of operators, the 2401 Automated Macro Defect Inspection System detects defects reliably and repeatably, allowing disposition decisions to be made quickly and accurately, dramatically reducing scrap and preventing further investment in low-yielding wafers.
    OEM Model Description
    None Provided
    Documents

    No documents

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