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6" Fab For Sale from Moov - Click Here to Learn More
6" Fab For Sale from Moov - Click Here to Learn More
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6" Fab For Sale from Moov - Click Here to Learn More
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KLA SURFSCAN SP3
    Description
    HD not included Good working condition Wafer Inspection System
    Configuration
    No Configuration
    OEM Model Description
    The Surfscan® SP3 is an unpatterned wafer inspection tool available in 450mm, 300mm, and 300mm/450mm bridge tool configurations. It uses deep ultra-violet (DUV) sensitivity and has a throughput up to three times that of its predecessor. It can detect critical defects and surface quality issues for IC, OEM, and substrate manufacturing at the 2Xnm design node. The tool also includes an integrated SURFmonitor module that characterizes and measures surface quality. It has flexible configurations and a reliable, extendible architecture. It is used for qualification and monitoring of process tools for the 2Xnm design node within the IC fab, as well as serving as a lithography process tool monitor. The Surfscan SP3 can also be used for incoming wafer qualification, inline process control, final wafer qualification, process tool qualification, and as a process uniformity monitor.
    Documents

    No documents

    KLA

    SURFSCAN SP3

    verified-listing-icon

    Verified

    CATEGORY
    Defect Inspection

    Last Verified: 29 days ago

    Key Item Details

    Condition:

    Used


    Operational Status:

    Unknown


    Product ID:

    105386


    Wafer Sizes:

    Unknown


    Vintage:

    2017


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Similar Listings
    View All
    KLA SURFSCAN SP3

    KLA

    SURFSCAN SP3

    Defect Inspection
    Vintage: 2017Condition: Used
    Last Verified29 days ago

    KLA

    SURFSCAN SP3

    verified-listing-icon
    Verified
    CATEGORY
    Defect Inspection
    Last Verified: 29 days ago
    listing-photo-660d5f95eed149879019a857a13f92c3-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1705/660d5f95eed149879019a857a13f92c3/cdae5ed88a0f4aacabfc5e46cc924226_5_mw.jpg
    listing-photo-660d5f95eed149879019a857a13f92c3-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1705/660d5f95eed149879019a857a13f92c3/de11d5485f324c2e9f75537f1a547f84_3_mw.jpg
    listing-photo-660d5f95eed149879019a857a13f92c3-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1705/660d5f95eed149879019a857a13f92c3/6fe591cd23fb481d8a73a832cd193501_1_mw.jpg
    listing-photo-660d5f95eed149879019a857a13f92c3-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1705/660d5f95eed149879019a857a13f92c3/bb3f45609c314d11801e1e8cadcc4adb_2_mw.jpg
    listing-photo-660d5f95eed149879019a857a13f92c3-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1705/660d5f95eed149879019a857a13f92c3/20382d6aa95e45e5b5cc296750f1e94b_4_mw.jpg
    Key Item Details

    Condition:

    Used


    Operational Status:

    Unknown


    Product ID:

    105386


    Wafer Sizes:

    Unknown


    Vintage:

    2017


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Description
    HD not included Good working condition Wafer Inspection System
    Configuration
    No Configuration
    OEM Model Description
    The Surfscan® SP3 is an unpatterned wafer inspection tool available in 450mm, 300mm, and 300mm/450mm bridge tool configurations. It uses deep ultra-violet (DUV) sensitivity and has a throughput up to three times that of its predecessor. It can detect critical defects and surface quality issues for IC, OEM, and substrate manufacturing at the 2Xnm design node. The tool also includes an integrated SURFmonitor module that characterizes and measures surface quality. It has flexible configurations and a reliable, extendible architecture. It is used for qualification and monitoring of process tools for the 2Xnm design node within the IC fab, as well as serving as a lithography process tool monitor. The Surfscan SP3 can also be used for incoming wafer qualification, inline process control, final wafer qualification, process tool qualification, and as a process uniformity monitor.
    Documents

    No documents

    Similar Listings
    View All
    KLA SURFSCAN SP3

    KLA

    SURFSCAN SP3

    Defect InspectionVintage: 2017Condition: UsedLast Verified:29 days ago
    KLA SURFSCAN SP3

    KLA

    SURFSCAN SP3

    Defect InspectionVintage: 0Condition: RefurbishedLast Verified:Over 60 days ago