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KLA SURFSCAN SP2
  • KLA SURFSCAN SP2
  • KLA SURFSCAN SP2
Description
working condition, but no HDD
Configuration
No Configuration
OEM Model Description
The Surfscan SP2 is an unpatterned wafer surface inspection tool that uses UV laser technology, darkfield optics, and advanced algorithms to detect defects as small as 30nm. It provides high sensitivity detection on engineered substrates and has a significant throughput increase over the prior-generation tool. It offers a single tool solution for three technology nodes and has comprehensive wafer surface inspection capabilities. It also enables faster root-cause analysis with improved coordinate accuracy and real-time defect classification capability.
Documents
PREFERRED
 
SELLER
CATEGORY
Defect Inspection

Last Verified: Over 60 days ago

Buyer pays 12% premium of final sale price
Key Item Details

Condition:

Used


Operational Status:

Unknown


Product ID:

84587


Wafer Sizes:

12"/300mm


Vintage:

2006


Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
PREFERRED
 
SELLER

KLA

SURFSCAN SP2

verified-listing-icon
Verified
CATEGORY
Defect Inspection
Last Verified: Over 60 days ago
listing-photo-24ed875185a74fa4ad79d730384cee6b-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/54780/24ed875185a74fa4ad79d730384cee6b/08a7ced9fabe4b808fbbdac163392d04_33d2f293e7d242b98632efe5db2247521201a_mw.jpeg
listing-photo-24ed875185a74fa4ad79d730384cee6b-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/54780/24ed875185a74fa4ad79d730384cee6b/62642a34a92240a1ba533071d9749eb9_941ccf33b25644c2a075368e69c4bb64_mw.jpeg
Buyer pays 12% premium of final sale price
Key Item Details

Condition:

Used


Operational Status:

Unknown


Product ID:

84587


Wafer Sizes:

12"/300mm


Vintage:

2006


Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
working condition, but no HDD
Configuration
No Configuration
OEM Model Description
The Surfscan SP2 is an unpatterned wafer surface inspection tool that uses UV laser technology, darkfield optics, and advanced algorithms to detect defects as small as 30nm. It provides high sensitivity detection on engineered substrates and has a significant throughput increase over the prior-generation tool. It offers a single tool solution for three technology nodes and has comprehensive wafer surface inspection capabilities. It also enables faster root-cause analysis with improved coordinate accuracy and real-time defect classification capability.
Documents