No	 name	                                                                                                             Quantity               Unit
1	 host console		                                                                                                 1                       tower
2	 Computer monitors and screen stands		                                                         1                       tower
3	 Keyboard and mouse set	                                                                                 1                       Group
4	 laser group		                                                                                                 1                       Group
5	 Stage shaft and base		                                                                                 1                       Group
6	 6 inch stage parts-1 (Centering Ring: lifting wafer use )		                         1                      individual
7	 6 inch stage parts-2 (POROUS Chuck)	                                                                 1	                 individual
8	 6 inch stage parts-3 (Ring Chuck)	                                                                         1	                 individual
9	 4 inch stage parts-1 (Centering Ring: lifting wafer use )	                                 1	                 individual
10	 4 inch stage parts-2 (POROUS Chuck)	                                                                 1	                 individual
11	 4 inch stage parts-3 (Ring Chuck)	                                                                         1	                 individual
12	Pre-Aligner	                                                                                                         1	                  tower
13	 Robot Arm	                                                                                                         1	                  tower
14	 Electronic Rack	                                                                                                  5	                  tower
15	 Robot Controller	                                                                                                  1	                  tower
16	 Special screwdriver	                                                                                          2	                 branch
17	 key ( switch Inter Lock For status )	                                                                          2	                 branch
18	 For testing machines wafer	                                                                                  5	                  piece
19	 Robot Software CD & check list	                                                                          1	            piece / open
20	 Offline Line Software manual	                                                                                  1	                  Book
21	 Electrical plug	                                                                                                          1	                   strip
22	 Old version load portBase	                                                                                  6	                Group
23	 Load port Component	                                                                                          2	                    Bag
24	 fixed bracket ( Fixed when moving the machine parts use )	                                  1	                    Bag

KLA CANDELA 8720.pdf

KLA inhabits two worlds: one that’s nanometers in scale and one that’s global. This micro and macro view gives us a unique perspective. We see electrons wave and industries transform. When you put deep science together with optimism, big things happen.

Our process-control and process-enabling solutions are designed to boost the innovation speed of the electronics industry. We help our customers achieve leading-edge performance.

The Candela 8720 wafer inspection system uses proprietary optical technology to detect and classify a broad range of defects on high-end compound semiconductor materials up to 200mm in diameter. It is suitable for macro and micro defects and has various use cases in quality control, process control, and vendor comparison. It is used in industries such as HBLED, MicroLED, GaN RF and power applications, and communications. Options include SECS-GEM, light tower, diamond scribe, calibration standards, offline software, OCR, and photoluminescence.

KLA

CANDELA 8720

Defect Inspection

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CANDELA 8720

Defect Inspection

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