CANDELA 8720
Category
Defect InspectionOverview
The Candela 8720 wafer inspection system uses proprietary optical technology to detect and classify a broad range of defects on high-end compound semiconductor materials up to 200mm in diameter. It is suitable for macro and micro defects and has various use cases in quality control, process control, and vendor comparison. It is used in industries such as HBLED, MicroLED, GaN RF and power applications, and communications. Options include SECS-GEM, light tower, diamond scribe, calibration standards, offline software, OCR, and photoluminescence.
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KLA
CANDELA 8720
Defect InspectionVintage: 2017Condition: UsedLast Verified2 days agoKLA
CANDELA 8720
Defect InspectionVintage: Condition: UsedLast Verified9 days agoKLA
CANDELA 8720
Defect InspectionVintage: Condition: UsedLast Verified15 days agoKLA
CANDELA 8720
Defect InspectionVintage: Condition: UsedLast VerifiedOver 60 days ago