Description
Laser Service History: The system is equipped with a new laser under warranty. Usage Environment: Previously used in an HDD (hard disk drive) manufacturing environment. Current Status: The system is currently sealed and stored in our lab. The tool is currently running on Windows XP Cleaning System Compatibility: There is no dedicated cleaning system included for aluminum or glass substrates.Configuration
No ConfigurationOEM Model Description
The Candela™ 7100 is a hard disk inspection system that detects and classifies submicron defects such as micro-pits, bumps, particles, and buried defects. It helps manufacturers maximize yield and lower the total cost of hard disk inspection. It also reduces the dependency on manual, non-production tools and methods for defect investigation and root cause identification.Documents
No documents
Verified
CATEGORY
Defect Inspection
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Deinstalled / Uncrated
Product ID:
128183
Wafer Sizes:
Unknown
Vintage:
2012
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
KLA
CANDELA 7100
CATEGORY
Defect Inspection
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Deinstalled / Uncrated
Product ID:
128183
Wafer Sizes:
Unknown
Vintage:
2012
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
Laser Service History: The system is equipped with a new laser under warranty. Usage Environment: Previously used in an HDD (hard disk drive) manufacturing environment. Current Status: The system is currently sealed and stored in our lab. The tool is currently running on Windows XP Cleaning System Compatibility: There is no dedicated cleaning system included for aluminum or glass substrates.Configuration
No ConfigurationOEM Model Description
The Candela™ 7100 is a hard disk inspection system that detects and classifies submicron defects such as micro-pits, bumps, particles, and buried defects. It helps manufacturers maximize yield and lower the total cost of hard disk inspection. It also reduces the dependency on manual, non-production tools and methods for defect investigation and root cause identification.Documents
No documents