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KLA 2810
    Description
    KLA2810 lamp
    Configuration
    No Configuration
    OEM Model Description
    For broadband optical defect inspection. In June 2007 KLA introduced the newest additions to our 28xx product series, the 2810 and 2815. Targeting the 45nm node, these are the first inspection systems designed specifically for memory or logic applications. The 2810 and 2815 have twice the computing speed of the 2800 and new optical modes that enable increased defect capture.
    Documents

    No documents

    KLA

    2810

    verified-listing-icon

    Verified

    CATEGORY
    Defect Inspection

    Last Verified: Over 60 days ago

    Key Item Details
    Condition:

    Used

    Operational Status:

    Unknown

    Product ID:

    101316

    Wafer Sizes:

    12"/300mm

    Vintage:

    Unknown

    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Similar Listings
    View All
    KLA 2810

    KLA

    2810

    Defect Inspection
    Vintage: 0Condition: Used
    Last VerifiedOver 60 days ago

    KLA

    2810

    verified-listing-icon
    Verified
    CATEGORY
    Defect Inspection
    Last Verified: Over 60 days ago
    listing-photo-14342a7f4a9f44d3b9622b957a925f9a-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    Key Item Details
    Condition:

    Used

    Operational Status:

    Unknown

    Product ID:

    101316

    Wafer Sizes:

    12"/300mm

    Vintage:

    Unknown

    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Description
    KLA2810 lamp
    Configuration
    No Configuration
    OEM Model Description
    For broadband optical defect inspection. In June 2007 KLA introduced the newest additions to our 28xx product series, the 2810 and 2815. Targeting the 45nm node, these are the first inspection systems designed specifically for memory or logic applications. The 2810 and 2815 have twice the computing speed of the 2800 and new optical modes that enable increased defect capture.
    Documents

    No documents

    Similar Listings
    View All
    KLA 2810

    KLA

    2810

    Defect InspectionVintage: 0Condition: UsedLast Verified:Over 60 days ago