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6" Fab For Sale from Moov - Click Here to Learn More
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6" Fab For Sale from Moov - Click Here to Learn More
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KLA SP1 CLASSIC
    Description
    KLA SP1 (USA)
    Configuration
    No Configuration
    OEM Model Description
    The Surfscan® SP1 is an unpatterned surface inspection system that provides the sensitivity, repeatability, surface quality measurements and throughput capabilities required for 0.18 µm process technologies and beyond. It is designed for wafer, equipment and IC manufacturers. The SP1 provides 0.08 µm sensitivity on well-polished silicon at 95% capture, as well as throughputs of up to 150 wph on 200 mm wafers, and up to 100 wph on 300 mm wafers.
    Documents

    No documents

    KLA

    SP1 CLASSIC

    verified-listing-icon

    Verified

    CATEGORY
    Defect Inspection

    Last Verified: Over 60 days ago

    Key Item Details

    Condition:

    Used


    Operational Status:

    Unknown


    Product ID:

    108433


    Wafer Sizes:

    Unknown


    Vintage:

    Unknown


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Similar Listings
    View All
    KLA SP1 CLASSIC

    KLA

    SP1 CLASSIC

    Defect Inspection
    Vintage: 0Condition: Used
    Last VerifiedYesterday

    KLA

    SP1 CLASSIC

    verified-listing-icon
    Verified
    CATEGORY
    Defect Inspection
    Last Verified: Over 60 days ago
    listing-photo-80d94173d8b64c3ba81695e9777a78c1-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    Key Item Details

    Condition:

    Used


    Operational Status:

    Unknown


    Product ID:

    108433


    Wafer Sizes:

    Unknown


    Vintage:

    Unknown


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Description
    KLA SP1 (USA)
    Configuration
    No Configuration
    OEM Model Description
    The Surfscan® SP1 is an unpatterned surface inspection system that provides the sensitivity, repeatability, surface quality measurements and throughput capabilities required for 0.18 µm process technologies and beyond. It is designed for wafer, equipment and IC manufacturers. The SP1 provides 0.08 µm sensitivity on well-polished silicon at 95% capture, as well as throughputs of up to 150 wph on 200 mm wafers, and up to 100 wph on 300 mm wafers.
    Documents

    No documents

    Similar Listings
    View All
    KLA SP1 CLASSIC

    KLA

    SP1 CLASSIC

    Defect InspectionVintage: 0Condition: UsedLast Verified:Yesterday
    KLA SP1 CLASSIC

    KLA

    SP1 CLASSIC

    Defect InspectionVintage: 0Condition: UsedLast Verified:Over 60 days ago