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6" Fab For Sale from Moov - Click Here to Learn More
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6" Fab For Sale from Moov - Click Here to Learn More
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KLA eS805
    Description
    E-beam Inspection
    Configuration
    No Configuration
    OEM Model Description
    The eS805 Series electron-beam wafer defect inspection systems capture physical and electrical defects on a broad range of materials, layers and structures and feature a new image computer, new auto-focus subsystem and higher beam current densities.
    Documents

    No documents

    KLA

    eS805

    verified-listing-icon

    Verified

    CATEGORY
    Defect Inspection

    Last Verified: 16 days ago

    Key Item Details
    Condition:

    Used

    Operational Status:

    Unknown

    Product ID:

    50097

    Wafer Sizes:

    12"/300mm

    Vintage:

    Unknown

    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Similar Listings
    View All
    KLA eS805

    KLA

    eS805

    Defect Inspection
    Vintage: 0Condition: Used
    Last Verified16 days ago

    KLA

    eS805

    verified-listing-icon
    Verified
    CATEGORY
    Defect Inspection
    Last Verified: 16 days ago
    listing-photo-081833c64422445888d82f4648c617b3-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    Key Item Details
    Condition:

    Used

    Operational Status:

    Unknown

    Product ID:

    50097

    Wafer Sizes:

    12"/300mm

    Vintage:

    Unknown

    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Description
    E-beam Inspection
    Configuration
    No Configuration
    OEM Model Description
    The eS805 Series electron-beam wafer defect inspection systems capture physical and electrical defects on a broad range of materials, layers and structures and feature a new image computer, new auto-focus subsystem and higher beam current densities.
    Documents

    No documents

    Similar Listings
    View All
    KLA eS805

    KLA

    eS805

    Defect InspectionVintage: 0Condition: UsedLast Verified:16 days ago