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KLA / ICOS WI-2280
    Description
    No missing
    Configuration
    No Configuration
    OEM Model Description
    Designed specifically for defect inspection and 2D metrology for LED applications, the ICOS WI-2280 also provides enhanced inspection capabilities and increased flexibility for microelectromechanical systems (MEMS) and semiconductor wafers spanning two inches to eight inches in size.
    Documents

    No documents

    KLA / ICOS

    WI-2280

    verified-listing-icon

    Verified

    CATEGORY
    Defect Inspection

    Last Verified: Yesterday

    Key Item Details
    Condition:

    Used

    Operational Status:

    Unknown

    Product ID:

    137485

    Wafer Sizes:

    Unknown

    Vintage:

    Unknown

    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Similar Listings
    View All
    KLA / ICOS WI-2280

    KLA / ICOS

    WI-2280

    Defect Inspection
    Vintage: 0Condition: Used
    Last VerifiedYesterday
    KLA / ICOS WI-2280

    KLA / ICOS

    WI-2280

    Defect Inspection
    Vintage: 0Condition: Used
    Last VerifiedOver 60 days ago

    KLA / ICOS

    WI-2280

    verified-listing-icon
    Verified
    CATEGORY
    Defect Inspection
    Last Verified: Yesterday
    listing-photo-ef7ccb18574c415295c5ed6fdbb5c47e-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/75258/ef7ccb18574c415295c5ed6fdbb5c47e/70a175cce6e04ee9985f25179346d14d_84061764834243_mw.jpg
    Key Item Details
    Condition:

    Used

    Operational Status:

    Unknown

    Product ID:

    137485

    Wafer Sizes:

    Unknown

    Vintage:

    Unknown

    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Description
    No missing
    Configuration
    No Configuration
    OEM Model Description
    Designed specifically for defect inspection and 2D metrology for LED applications, the ICOS WI-2280 also provides enhanced inspection capabilities and increased flexibility for microelectromechanical systems (MEMS) and semiconductor wafers spanning two inches to eight inches in size.
    Documents

    No documents

    Similar Listings
    View All
    KLA / ICOS WI-2280

    KLA / ICOS

    WI-2280

    Defect InspectionVintage: 0Condition: UsedLast Verified:Yesterday
    KLA / ICOS WI-2280

    KLA / ICOS

    WI-2280

    Defect InspectionVintage: 0Condition: UsedLast Verified:Over 60 days ago