WI-2280
Category
Defect InspectionOverview
Designed specifically for defect inspection and 2D metrology for LED applications, the ICOS WI-2280 also provides enhanced inspection capabilities and increased flexibility for microelectromechanical systems (MEMS) and semiconductor wafers spanning two inches to eight inches in size.
Active Listings
6
Services
Inspection, Insurance, Appraisal, Logistics
Top Listings
- WI-2280Defect InspectionVintage: Condition: UsedLast VerifiedOver 60 days ago
- WI-2280Defect InspectionVintage: Condition: UsedLast VerifiedOver 60 days ago
- WI-2280Defect InspectionVintage: Condition: UsedLast VerifiedOver 60 days ago
- WI-2280Defect InspectionVintage: 2013Condition: UsedLast VerifiedOver 30 days ago