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6" Fab For Sale from Moov - Click Here to Learn More
6" Fab For Sale from Moov - Click Here to Learn More
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6" Fab For Sale from Moov - Click Here to Learn More
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KLA / ICOS WI-2280
    Description
    Wafer Inspection Equipment
    Configuration
    No Configuration
    OEM Model Description
    Designed specifically for defect inspection and 2D metrology for LED applications, the ICOS WI-2280 also provides enhanced inspection capabilities and increased flexibility for microelectromechanical systems (MEMS) and semiconductor wafers spanning two inches to eight inches in size.
    Documents

    No documents

    KLA / ICOS

    WI-2280

    verified-listing-icon

    Verified

    CATEGORY
    Defect Inspection

    Last Verified: 16 days ago

    Key Item Details

    Condition:

    Used


    Operational Status:

    Unknown


    Product ID:

    113744


    Wafer Sizes:

    6"/150mm


    Vintage:

    Unknown


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Similar Listings
    View All
    KLA / ICOS WI-2280

    KLA / ICOS

    WI-2280

    Defect Inspection
    Vintage: 0Condition: Used
    Last Verified16 days ago

    KLA / ICOS

    WI-2280

    verified-listing-icon
    Verified
    CATEGORY
    Defect Inspection
    Last Verified: 16 days ago
    listing-photo-9a4c54212d7b4b4185a4d7f9299360e5-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    Key Item Details

    Condition:

    Used


    Operational Status:

    Unknown


    Product ID:

    113744


    Wafer Sizes:

    6"/150mm


    Vintage:

    Unknown


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Description
    Wafer Inspection Equipment
    Configuration
    No Configuration
    OEM Model Description
    Designed specifically for defect inspection and 2D metrology for LED applications, the ICOS WI-2280 also provides enhanced inspection capabilities and increased flexibility for microelectromechanical systems (MEMS) and semiconductor wafers spanning two inches to eight inches in size.
    Documents

    No documents

    Similar Listings
    View All
    KLA / ICOS WI-2280

    KLA / ICOS

    WI-2280

    Defect InspectionVintage: 0Condition: UsedLast Verified:16 days ago
    KLA / ICOS WI-2280

    KLA / ICOS

    WI-2280

    Defect InspectionVintage: 0Condition: UsedLast Verified:16 days ago
    KLA / ICOS WI-2280

    KLA / ICOS

    WI-2280

    Defect InspectionVintage: 0Condition: UsedLast Verified:Over 60 days ago