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6" Fab For Sale from Moov - Click Here to Learn More
6" Fab For Sale from Moov - Click Here to Learn More
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6" Fab For Sale from Moov - Click Here to Learn More
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APPLIED MATERIALS (AMAT) WF-736
    Description
    AMAT WF-736DUV DF Defect inspection tool
    Configuration
    No Configuration
    OEM Model Description
    Using laser-based technology, Applied Materials’ WF-736 system detects defects on patterned wafers (wafers with circuit images printed on them) as they move between processing steps. Defects may include particles, open circuit lines, shorts between lines or other problems.
    Documents

    No documents

    APPLIED MATERIALS (AMAT)

    WF-736

    verified-listing-icon

    Verified

    CATEGORY
    Defect Inspection

    Last Verified: Over 30 days ago

    Key Item Details

    Condition:

    Used


    Operational Status:

    Unknown


    Product ID:

    114076


    Wafer Sizes:

    8"/200mm


    Vintage:

    2000


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Similar Listings
    View All
    APPLIED MATERIALS (AMAT) WF-736

    APPLIED MATERIALS (AMAT)

    WF-736

    Defect Inspection
    Vintage: 2000Condition: Used
    Last VerifiedOver 30 days ago

    APPLIED MATERIALS (AMAT)

    WF-736

    verified-listing-icon
    Verified
    CATEGORY
    Defect Inspection
    Last Verified: Over 30 days ago
    listing-photo-d8748cc9a0104194a7cec4bc1272851c-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    Key Item Details

    Condition:

    Used


    Operational Status:

    Unknown


    Product ID:

    114076


    Wafer Sizes:

    8"/200mm


    Vintage:

    2000


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Description
    AMAT WF-736DUV DF Defect inspection tool
    Configuration
    No Configuration
    OEM Model Description
    Using laser-based technology, Applied Materials’ WF-736 system detects defects on patterned wafers (wafers with circuit images printed on them) as they move between processing steps. Defects may include particles, open circuit lines, shorts between lines or other problems.
    Documents

    No documents

    Similar Listings
    View All
    APPLIED MATERIALS (AMAT) WF-736

    APPLIED MATERIALS (AMAT)

    WF-736

    Defect InspectionVintage: 2000Condition: UsedLast Verified:Over 30 days ago