Skip to main content
6" Fab For Sale from Moov - Click Here to Learn More
6" Fab For Sale from Moov - Click Here to Learn More
Moov logo

6" Fab For Sale from Moov - Click Here to Learn More
Moov Icon
APPLIED MATERIALS (AMAT) SEMVision cX
    Description
    Calibration Tool-NEW
    Configuration
    No Configuration
    OEM Model Description
    The SEMVision cX is designed for the automatic review and classification of wafer defects in advanced semiconductor production lines. It builds on the company’s SEMVision system and features automatic material identification that characterizes defects on unpatterned wafers and provides chipmakers with information on the defect’s source. The system also offers high-productivity operation at 500 defects per hour and color MPSI (Multiple Perspective SEM Imaging) for enhanced topography and material information. The SEMVision cX is the first SEM review system to feature OperatorFree EDX (energy dispersive x-ray) analysis that increases processing speed of the system and requires less engineering expertise. For the first time, material information is combined with automated defect classification (ADC) to provide fab engineers with all vital defect data.
    Documents

    No documents

    APPLIED MATERIALS (AMAT)

    SEMVision cX

    verified-listing-icon

    Verified

    CATEGORY
    Defect Inspection

    Last Verified: Over 60 days ago

    Key Item Details

    Condition:

    Used


    Operational Status:

    Unknown


    Product ID:

    17059


    Wafer Sizes:

    Unknown


    Vintage:

    Unknown


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Similar Listings
    View All
    APPLIED MATERIALS (AMAT) SEMVision cX

    APPLIED MATERIALS (AMAT)

    SEMVision cX

    Defect Inspection
    Vintage: 2000Condition: Used
    Last VerifiedOver 60 days ago

    APPLIED MATERIALS (AMAT)

    SEMVision cX

    verified-listing-icon
    Verified
    CATEGORY
    Defect Inspection
    Last Verified: Over 60 days ago
    listing-photo-H4e9D58SfSsXfNj9KMcBPb6oZyDfzNm-81PEdgzzAXM-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/Ot4uSyt7j-OkIRBJeE4orTieeZmN71mOLX5X1zTe7fk/H4e9D58SfSsXfNj9KMcBPb6oZyDfzNm-81PEdgzzAXM/MJCoLCxLatHSz91UbWvVi6EF6Hx43Q6mtkUAfGgyiwk_20190315_091833_f
    Key Item Details

    Condition:

    Used


    Operational Status:

    Unknown


    Product ID:

    17059


    Wafer Sizes:

    Unknown


    Vintage:

    Unknown


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Description
    Calibration Tool-NEW
    Configuration
    No Configuration
    OEM Model Description
    The SEMVision cX is designed for the automatic review and classification of wafer defects in advanced semiconductor production lines. It builds on the company’s SEMVision system and features automatic material identification that characterizes defects on unpatterned wafers and provides chipmakers with information on the defect’s source. The system also offers high-productivity operation at 500 defects per hour and color MPSI (Multiple Perspective SEM Imaging) for enhanced topography and material information. The SEMVision cX is the first SEM review system to feature OperatorFree EDX (energy dispersive x-ray) analysis that increases processing speed of the system and requires less engineering expertise. For the first time, material information is combined with automated defect classification (ADC) to provide fab engineers with all vital defect data.
    Documents

    No documents

    Similar Listings
    View All
    APPLIED MATERIALS (AMAT) SEMVision cX

    APPLIED MATERIALS (AMAT)

    SEMVision cX

    Defect InspectionVintage: 2000Condition: UsedLast Verified:Over 60 days ago
    APPLIED MATERIALS (AMAT) SEMVision cX

    APPLIED MATERIALS (AMAT)

    SEMVision cX

    Defect InspectionVintage: 0Condition: UsedLast Verified:Over 60 days ago