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APPLIED MATERIALS (AMAT) UVISION 4
    Description
    Metrology
    Configuration
    No Configuration
    OEM Model Description
    The Applied UVision® 4 wafer Inspection system was introduced in 2010, enabling customers to detect yield-limiting defects in the critical patterning layers of 32nm and below logic and memory devices using DUV laser-based imaging technology. The UVision 4 system’s extendable architecture of high-power polarized deep ultra-violet laser, optimized scattered light collection, and advanced noise reduction capabilities, addresses the inspection challenges of 32nm and below with optical inspection capabilities beyond the resolution limits of conventional brightfield (BF) inspection. Innovative algorithms enable simultaneous detection of systematic mask induced defects (i.e., "haze" defects) and random defects at production worthy throughput made possible by an enhanced image processor. Wide dynamic range detection schemes eliminate the multiple region-specific scans previously required, enabling regions of a chip with differing contrasts to be imaged with optimal sensitivity in a single pass without compromising throughput.
    Documents

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    APPLIED MATERIALS (AMAT)

    UVISION 4

    verified-listing-icon

    Verified

    CATEGORY
    Defect Inspection

    Last Verified: Over 60 days ago

    Key Item Details

    Condition:

    Used


    Operational Status:

    Unknown


    Product ID:

    105631


    Wafer Sizes:

    Unknown


    Vintage:

    Unknown


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Similar Listings
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    APPLIED MATERIALS (AMAT) UVISION 4

    APPLIED MATERIALS (AMAT)

    UVISION 4

    Defect Inspection
    Vintage: 0Condition: Used
    Last VerifiedOver 60 days ago

    APPLIED MATERIALS (AMAT)

    UVISION 4

    verified-listing-icon
    Verified
    CATEGORY
    Defect Inspection
    Last Verified: Over 60 days ago
    listing-photo-474bab58f0c045e78afa9623c7961d4c-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    Key Item Details

    Condition:

    Used


    Operational Status:

    Unknown


    Product ID:

    105631


    Wafer Sizes:

    Unknown


    Vintage:

    Unknown


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Description
    Metrology
    Configuration
    No Configuration
    OEM Model Description
    The Applied UVision® 4 wafer Inspection system was introduced in 2010, enabling customers to detect yield-limiting defects in the critical patterning layers of 32nm and below logic and memory devices using DUV laser-based imaging technology. The UVision 4 system’s extendable architecture of high-power polarized deep ultra-violet laser, optimized scattered light collection, and advanced noise reduction capabilities, addresses the inspection challenges of 32nm and below with optical inspection capabilities beyond the resolution limits of conventional brightfield (BF) inspection. Innovative algorithms enable simultaneous detection of systematic mask induced defects (i.e., "haze" defects) and random defects at production worthy throughput made possible by an enhanced image processor. Wide dynamic range detection schemes eliminate the multiple region-specific scans previously required, enabling regions of a chip with differing contrasts to be imaged with optimal sensitivity in a single pass without compromising throughput.
    Documents

    No documents

    Similar Listings
    View All
    APPLIED MATERIALS (AMAT) UVISION 4

    APPLIED MATERIALS (AMAT)

    UVISION 4

    Defect InspectionVintage: 0Condition: UsedLast Verified:Over 60 days ago
    APPLIED MATERIALS (AMAT) UVISION 4

    APPLIED MATERIALS (AMAT)

    UVISION 4

    Defect InspectionVintage: 0Condition: UsedLast Verified:Over 60 days ago
    APPLIED MATERIALS (AMAT) UVISION 4

    APPLIED MATERIALS (AMAT)

    UVISION 4

    Defect InspectionVintage: 2009Condition: UsedLast Verified:Over 60 days ago