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6" Fab For Sale from Moov - Click Here to Learn More
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6" Fab For Sale from Moov - Click Here to Learn More
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APPLIED MATERIALS (AMAT) SEMVISION G3
    Description
    No description
    Configuration
    No Configuration
    OEM Model Description
    The high-throughput, fully automatic Applied SEMVision G3 Defect Analysis products enable customers to use this technology as an integral part of their production lines to analyze defects as small as 30nm with industry-leading throughput. DR-SEMs review defects on the wafer (such as particles, scratches or residues) that are first located by a defect detection system and then classify the defects to identify their source. The high-throughput, fully automatic Applied SEMVisiontm G3 Defect Analysis products enable customers to use this technology as an integral part of their production lines to analyze defects as small as 30nm with industry-leading throughput. The Applied SEMVision G3 FIB integrates advanced defect review SEM capability with automated focused ion beam (FIB) technology in one system. The FIB provides a cross-sectional view of the defects reviewed by the SEM, enabling chipmakers to analyze the defects in minutes as part of their in-line review process.
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    APPLIED MATERIALS (AMAT)

    SEMVISION G3

    verified-listing-icon

    Verified

    CATEGORY
    Defect Inspection

    Last Verified: Over 60 days ago

    Key Item Details

    Condition:

    Used


    Operational Status:

    Unknown


    Product ID:

    45131


    Wafer Sizes:

    Unknown


    Vintage:

    2007


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Similar Listings
    View All
    APPLIED MATERIALS (AMAT) SEMVISION G3

    APPLIED MATERIALS (AMAT)

    SEMVISION G3

    Defect Inspection
    Vintage: 2008Condition: Used
    Last VerifiedOver 60 days ago

    APPLIED MATERIALS (AMAT)

    SEMVISION G3

    verified-listing-icon
    Verified
    CATEGORY
    Defect Inspection
    Last Verified: Over 60 days ago
    listing-photo-d21d066d612b494abbfe8b69bd4ea416-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    Key Item Details

    Condition:

    Used


    Operational Status:

    Unknown


    Product ID:

    45131


    Wafer Sizes:

    Unknown


    Vintage:

    2007


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Description
    No description
    Configuration
    No Configuration
    OEM Model Description
    The high-throughput, fully automatic Applied SEMVision G3 Defect Analysis products enable customers to use this technology as an integral part of their production lines to analyze defects as small as 30nm with industry-leading throughput. DR-SEMs review defects on the wafer (such as particles, scratches or residues) that are first located by a defect detection system and then classify the defects to identify their source. The high-throughput, fully automatic Applied SEMVisiontm G3 Defect Analysis products enable customers to use this technology as an integral part of their production lines to analyze defects as small as 30nm with industry-leading throughput. The Applied SEMVision G3 FIB integrates advanced defect review SEM capability with automated focused ion beam (FIB) technology in one system. The FIB provides a cross-sectional view of the defects reviewed by the SEM, enabling chipmakers to analyze the defects in minutes as part of their in-line review process.
    Documents

    No documents

    Similar Listings
    View All
    APPLIED MATERIALS (AMAT) SEMVISION G3

    APPLIED MATERIALS (AMAT)

    SEMVISION G3

    Defect InspectionVintage: 2008Condition: UsedLast Verified:Over 60 days ago
    APPLIED MATERIALS (AMAT) SEMVISION G3

    APPLIED MATERIALS (AMAT)

    SEMVISION G3

    Defect InspectionVintage: 2007Condition: UsedLast Verified:Over 60 days ago
    APPLIED MATERIALS (AMAT) SEMVISION G3

    APPLIED MATERIALS (AMAT)

    SEMVISION G3

    Defect InspectionVintage: 2008Condition: UsedLast Verified:Over 60 days ago