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APPLIED MATERIALS (AMAT) SEMVISION G3 FIB
    Description
    No description
    Configuration
    No Configuration
    OEM Model Description
    The Applied SEMVision G3 FIB integrates advanced defect review SEM capability with automated focused ion beam (FIB) technology in one system. The FIB provides a cross-sectional view of the defects reviewed by the SEM, enabling chipmakers to analyze the defects in minutes as part of their in-line review process.
    Documents

    No documents

    APPLIED MATERIALS (AMAT)

    SEMVISION G3 FIB

    verified-listing-icon

    Verified

    CATEGORY
    Defect Inspection

    Last Verified: 3 days ago

    Key Item Details
    Condition:

    Used

    Operational Status:

    Unknown

    Product ID:

    142921

    Wafer Sizes:

    Unknown

    Vintage:

    Unknown

    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Similar Listings
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    APPLIED MATERIALS (AMAT) SEMVISION G3 FIB

    APPLIED MATERIALS (AMAT)

    SEMVISION G3 FIB

    Defect Inspection
    Vintage: 0Condition: Used
    Last Verified3 days ago
    APPLIED MATERIALS (AMAT) SEMVISION G3 FIB

    APPLIED MATERIALS (AMAT)

    SEMVISION G3 FIB

    Defect Inspection
    Vintage: 0Condition: Used
    Last VerifiedOver 60 days ago

    APPLIED MATERIALS (AMAT)

    SEMVISION G3 FIB

    verified-listing-icon
    Verified
    CATEGORY
    Defect Inspection
    Last Verified: 3 days ago
    listing-photo-f55c7eab36a74807a9ef9a1e9926b1d7-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1979/f55c7eab36a74807a9ef9a1e9926b1d7/962444a0539241dca759b9140a829eec_53e7b66ac198467db018096715cfffc01105c_mw.jpeg
    listing-photo-f55c7eab36a74807a9ef9a1e9926b1d7-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1979/f55c7eab36a74807a9ef9a1e9926b1d7/003c875f57c14a24be16bde4427d4f78_7327ba4b85f340a4a0af923ea80c46fa1105c_mw.jpeg
    listing-photo-f55c7eab36a74807a9ef9a1e9926b1d7-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1979/f55c7eab36a74807a9ef9a1e9926b1d7/cce46e958c9349b9994ba3dab8b24d47_4b472c50a26f460097e016bc0456f92a1105c_mw.jpeg
    listing-photo-f55c7eab36a74807a9ef9a1e9926b1d7-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1979/f55c7eab36a74807a9ef9a1e9926b1d7/648584127bd74667a176ad32ec3f006d_ab99f585956d4bf5a45d3006f4260f701105c_mw.jpeg
    listing-photo-f55c7eab36a74807a9ef9a1e9926b1d7-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1979/f55c7eab36a74807a9ef9a1e9926b1d7/b9a1a0fd16854932b31a9fac7f8c077a_2e808dc45daa445ca31b822ef86367861105c_mw.jpeg
    listing-photo-f55c7eab36a74807a9ef9a1e9926b1d7-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1979/f55c7eab36a74807a9ef9a1e9926b1d7/b97146e3dd804fd0a2ec764195146fa8_15f79a35b6e042f7987345e76783cd0e1105c_mw.jpeg
    Key Item Details
    Condition:

    Used

    Operational Status:

    Unknown

    Product ID:

    142921

    Wafer Sizes:

    Unknown

    Vintage:

    Unknown

    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Description
    No description
    Configuration
    No Configuration
    OEM Model Description
    The Applied SEMVision G3 FIB integrates advanced defect review SEM capability with automated focused ion beam (FIB) technology in one system. The FIB provides a cross-sectional view of the defects reviewed by the SEM, enabling chipmakers to analyze the defects in minutes as part of their in-line review process.
    Documents

    No documents

    Similar Listings
    View All
    APPLIED MATERIALS (AMAT) SEMVISION G3 FIB

    APPLIED MATERIALS (AMAT)

    SEMVISION G3 FIB

    Defect InspectionVintage: 0Condition: UsedLast Verified:3 days ago
    APPLIED MATERIALS (AMAT) SEMVISION G3 FIB

    APPLIED MATERIALS (AMAT)

    SEMVISION G3 FIB

    Defect InspectionVintage: 0Condition: UsedLast Verified:Over 60 days ago