Description
No descriptionConfiguration
QPA_DefectOEM Model Description
Compass 300 Inspection system, tailored for monitoring processes up to the 100nm tech node. Detect critical flaws efficiently using OMNIView™, a cutting-edge laser scanning method that captures diverse defects across all layers.Documents
No documents
CATEGORY
Defect Inspection
Last Verified: 12 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
144874
Wafer Sizes:
12"/300mm
Vintage:
2002
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
APPLIED MATERIALS (AMAT)
COMPASS 300
CATEGORY
Defect Inspection
Last Verified: 12 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
144874
Wafer Sizes:
12"/300mm
Vintage:
2002
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
No descriptionConfiguration
QPA_DefectOEM Model Description
Compass 300 Inspection system, tailored for monitoring processes up to the 100nm tech node. Detect critical flaws efficiently using OMNIView™, a cutting-edge laser scanning method that captures diverse defects across all layers.Documents
No documents