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HITACHI S-6000
    Description
    No description
    Configuration
    No Configuration
    OEM Model Description
    The S-6000 was Hitachi's pioneering CD-SEM system for micro-scale dimensional measurement of semiconductors. Developed through a collaboration between Hitachi's electron microscope and semiconductor divisions, it aimed to provide a comprehensive measurement solution rather than just hardware. Designed with user-centric features, it eliminated the need for a dark room and offered easy calibration. Adopted globally by semiconductor manufacturers, the S-6000 set a new standard in semiconductor measurement, ensuring high reliability, accuracy, and user-friendliness.
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    HITACHI

    S-6000

    verified-listing-icon

    Verified

    CATEGORY
    CD-SEM

    Last Verified: Yesterday

    Key Item Details
    Condition:

    Used

    Operational Status:

    Unknown

    Product ID:

    117342

    Wafer Sizes:

    Unknown

    Vintage:

    Unknown

    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
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    Transaction Insured by Moov
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    Refurbishment Services
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    HITACHI S-6000

    HITACHI

    S-6000

    CD-SEM
    Vintage: 0Condition: Used
    Last VerifiedYesterday

    HITACHI

    S-6000

    verified-listing-icon
    Verified
    CATEGORY
    CD-SEM
    Last Verified: Yesterday
    listing-photo-d89e1ce0622a4b3093dd113c09b71cf6-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    Key Item Details
    Condition:

    Used

    Operational Status:

    Unknown

    Product ID:

    117342

    Wafer Sizes:

    Unknown

    Vintage:

    Unknown

    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Description
    No description
    Configuration
    No Configuration
    OEM Model Description
    The S-6000 was Hitachi's pioneering CD-SEM system for micro-scale dimensional measurement of semiconductors. Developed through a collaboration between Hitachi's electron microscope and semiconductor divisions, it aimed to provide a comprehensive measurement solution rather than just hardware. Designed with user-centric features, it eliminated the need for a dark room and offered easy calibration. Adopted globally by semiconductor manufacturers, the S-6000 set a new standard in semiconductor measurement, ensuring high reliability, accuracy, and user-friendliness.
    Documents

    No documents

    Similar Listings
    View All
    HITACHI S-6000

    HITACHI

    S-6000

    CD-SEMVintage: 0Condition: UsedLast Verified:Yesterday