Description
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The S-6000 was Hitachi's pioneering CD-SEM system for micro-scale dimensional measurement of semiconductors. Developed through a collaboration between Hitachi's electron microscope and semiconductor divisions, it aimed to provide a comprehensive measurement solution rather than just hardware. Designed with user-centric features, it eliminated the need for a dark room and offered easy calibration. Adopted globally by semiconductor manufacturers, the S-6000 set a new standard in semiconductor measurement, ensuring high reliability, accuracy, and user-friendliness.Documents
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HITACHI
S-6000
CATEGORY
CD-SEM
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
125126
Wafer Sizes:
Unknown
Vintage:
Unknown
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
No descriptionConfiguration
No ConfigurationOEM Model Description
The S-6000 was Hitachi's pioneering CD-SEM system for micro-scale dimensional measurement of semiconductors. Developed through a collaboration between Hitachi's electron microscope and semiconductor divisions, it aimed to provide a comprehensive measurement solution rather than just hardware. Designed with user-centric features, it eliminated the need for a dark room and offered easy calibration. Adopted globally by semiconductor manufacturers, the S-6000 set a new standard in semiconductor measurement, ensuring high reliability, accuracy, and user-friendliness.Documents
No documents