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HITACHI S-9380
    Description
    No description
    Configuration
    - Hitachi W51010T
    OEM Model Description
    The S-9380 is Hitachi’s most advanced CD-measurement SEM developed for 65 nm process control of semiconductor devices on wafers up to 300 mm in diameter. With improvement in both hardware and software, the S-9380 supports a high throughput of 33 wafers per hour with 20 measurement points per wafer, and resolution of 2.0 nm.
    Documents

    No documents

    HITACHI

    S-9380

    verified-listing-icon

    Verified

    CATEGORY

    CD-SEM
    Last Verified: 12 days ago
    Key Item Details
    Condition:

    Used

    Operational Status:

    Unknown

    Product ID:

    103599

    Wafer Sizes:

    Unknown

    Vintage:

    2008

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    Logistics Support
    Available
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    Transaction Insured by Moov
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    HITACHI

    S-9380

    verified-listing-icon

    Verified

    CATEGORY

    CD-SEM
    Last Verified: 12 days ago
    listing-photo-87e1fe7e58804e8c809b45b4f122775c-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/77608/87e1fe7e58804e8c809b45b4f122775c/1259d7908b2243af96adf3bfb118e98b_34d2eaffd8b34864b4700958cd08f2f645005c_mw.jpeg
    listing-photo-87e1fe7e58804e8c809b45b4f122775c-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/77608/87e1fe7e58804e8c809b45b4f122775c/b761499c090241eba8a95034afddfa16_59c22bf7bb464ac19388691e1fee1ecc45005c_mw.jpeg
    listing-photo-87e1fe7e58804e8c809b45b4f122775c-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/77608/87e1fe7e58804e8c809b45b4f122775c/52ce9d3638d547cbb248760f9ba88ec2_9eaa212e4db84800819b5e765932172b45005c_mw.jpeg
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    listing-photo-87e1fe7e58804e8c809b45b4f122775c-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/77608/87e1fe7e58804e8c809b45b4f122775c/c6c0b66955234522bfeeb76b9f594e6d_258a1985d5184f65bc3367a6b786001045005c_mw.jpeg
    listing-photo-87e1fe7e58804e8c809b45b4f122775c-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/77608/87e1fe7e58804e8c809b45b4f122775c/bcecc791e3914cffbef81ac9bb88fb68_75c616c377c64e5db26bd541e87acba845005c_mw.jpeg
    listing-photo-87e1fe7e58804e8c809b45b4f122775c-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/77608/87e1fe7e58804e8c809b45b4f122775c/e084f2c5ed3a4a8e92adef9490135933_b60cdc75d0354257a3cc5b6103d5e95845005c_mw.jpeg
    Key Item Details
    Condition:

    Used

    Operational Status:

    Unknown

    Product ID:

    103599

    Wafer Sizes:

    Unknown

    Vintage:

    2008

    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Description
    No description
    Configuration
    - Hitachi W51010T
    OEM Model Description
    The S-9380 is Hitachi’s most advanced CD-measurement SEM developed for 65 nm process control of semiconductor devices on wafers up to 300 mm in diameter. With improvement in both hardware and software, the S-9380 supports a high throughput of 33 wafers per hour with 20 measurement points per wafer, and resolution of 2.0 nm.
    Documents

    No documents

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