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HITACHI S-9260A
    Description
    CD-SEM
    Configuration
    No Configuration
    OEM Model Description
    The electron optical system of the Model S-9260 CD-SEM has a 3-nm image resolution, which is applicable to lines/spaces and hole patterns of less than 0.1 µm. Figs. 2 and 3 show examples of observations of the model. It has formula-editor and beam-tilt observation functions that enable detecting process variations early and controlling them easily.
    Documents

    No documents

    HITACHI

    S-9260A

    verified-listing-icon

    Verified

    CATEGORY

    CD-SEM
    Last Verified: 24 days ago
    Key Item Details
    Condition:

    Used

    Operational Status:

    Unknown

    Product ID:

    13980

    Wafer Sizes:

    8"/200mm

    Vintage:

    2003

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    HITACHI

    S-9260A

    verified-listing-icon

    Verified

    CATEGORY

    CD-SEM
    Last Verified: 24 days ago
    listing-photo-8TBLBvBjWrt0ZwxeS5Ml3MB9iavfQ5xWk76mW_14z3s-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    Key Item Details
    Condition:

    Used

    Operational Status:

    Unknown

    Product ID:

    13980

    Wafer Sizes:

    8"/200mm

    Vintage:

    2003

    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Description
    CD-SEM
    Configuration
    No Configuration
    OEM Model Description
    The electron optical system of the Model S-9260 CD-SEM has a 3-nm image resolution, which is applicable to lines/spaces and hole patterns of less than 0.1 µm. Figs. 2 and 3 show examples of observations of the model. It has formula-editor and beam-tilt observation functions that enable detecting process variations early and controlling them easily.
    Documents

    No documents

    Similar Listings
    View All
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    HITACHI S-9260A
    HITACHI
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    CD-SEMVintage: 2003Condition: UsedLast Verified: 24 days ago