
Description
CD-SEM systemConfiguration
Open wafer cassette loading CD measurementOEM Model Description
High-resolution critical-dimension measurement scanning electron microscopes (CD-SEMs)Documents
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S-8840
CATEGORY
CD-SEM
Last Verified: 16 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
155822
Wafer Sizes:
6"/150mm
Vintage:
1997
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
CD-SEM systemConfiguration
Open wafer cassette loading CD measurementOEM Model Description
High-resolution critical-dimension measurement scanning electron microscopes (CD-SEMs)Documents
No documents