Description
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Resolution 5nm, Repeatability 1%, CD range ≥0.1μm Original spec - 8inch Si Notched Modified spec - 8inch Si/ SiC/ GaAs/ GaN/LiTaO/ SapphireOEM Model Description
High-resolution critical-dimension measurement scanning electron microscopes (CD-SEMs)Documents
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HITACHI
S-8840
CATEGORY
CD-SEM
Last Verified: Over 60 days ago
Key Item Details
Condition:
Refurbished
Operational Status:
Unknown
Product ID:
131710
Wafer Sizes:
8"/200mm
Vintage:
Unknown
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
No descriptionConfiguration
Resolution 5nm, Repeatability 1%, CD range ≥0.1μm Original spec - 8inch Si Notched Modified spec - 8inch Si/ SiC/ GaAs/ GaN/LiTaO/ SapphireOEM Model Description
High-resolution critical-dimension measurement scanning electron microscopes (CD-SEMs)Documents
No documents