Description
SEM - Critical Dimension (CD) MeasurementConfiguration
No ConfigurationOEM Model Description
CG5000 is designed to meet the needs for higher accuracy and versatility in development and manufacturing processes of new generation semiconductor devices. Hitachi High-Tech achieved new records*2 for throughput and metrology accuracy repeatability with the CG5000 by redesigning the transfer system and employing improved electron optics and image processing technologies.Documents
No documents
HITACHI
CG5000
Verified
CATEGORY
CD-SEM
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
84403
Wafer Sizes:
12"/300mm
Vintage:
Unknown
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Logistics Support
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Money Back Guarantee
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Refurbishment Services
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View AllHITACHI
CG5000
Verified
CATEGORY
CD-SEM
Last Verified: 26 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
84403
Wafer Sizes:
12"/300mm
Vintage:
Unknown
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
SEM - Critical Dimension (CD) MeasurementConfiguration
No ConfigurationOEM Model Description
CG5000 is designed to meet the needs for higher accuracy and versatility in development and manufacturing processes of new generation semiconductor devices. Hitachi High-Tech achieved new records*2 for throughput and metrology accuracy repeatability with the CG5000 by redesigning the transfer system and employing improved electron optics and image processing technologies.Documents
No documents