Description
SEM - Critical Dimension (CD) MeasurementConfiguration
No ConfigurationOEM Model Description
The CG4000 is a cutting-edge solution for process applications, offering advanced functions that enhance both precision and efficiency. Its high-accuracy averaged CD (ACD) metrology function improves repeatability and throughput, while its industry-standard line edge roughness (LER) measurement function contributes significantly to process monitoring. These features make the CG4000 an essential tool for maintaining high standards in process applications.Documents
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HITACHI
CG4000
Verified
CATEGORY
CD-SEM
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
65627
Wafer Sizes:
12"/300mm
Vintage:
2007
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Logistics Support
Available
Money Back Guarantee
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Transaction Insured by Moov
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Refurbishment Services
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HITACHI
CG4000
Verified
CATEGORY
CD-SEM
Last Verified: 27 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
65627
Wafer Sizes:
12"/300mm
Vintage:
2007
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
SEM - Critical Dimension (CD) MeasurementConfiguration
No ConfigurationOEM Model Description
The CG4000 is a cutting-edge solution for process applications, offering advanced functions that enhance both precision and efficiency. Its high-accuracy averaged CD (ACD) metrology function improves repeatability and throughput, while its industry-standard line edge roughness (LER) measurement function contributes significantly to process monitoring. These features make the CG4000 an essential tool for maintaining high standards in process applications.Documents
No documents