Automatic Double Sided Post-Dicing Wafer Chip Inspection System

CHROMA

7936

-Combination Final Test & System Level Test Handler (2-in-1 System)
-Perfect for device engineering characterization gathering and analysis
-Supports Remote Control Function
-Auto tray load / unload & device sorting capability
-Tester zero waiting time
-Maximize Test Socket lifetime
-Air damper for excellent contact balance
-Anti-double stack feature
-Camera for real time system monitoring
-Tri-temp IC test function (optional)
-High power cooling function (optional)
-Diskless download function (optional)

3110

The Chroma 3160 Handler is a productive pick & place system for high volume multi-site IC testing. Saving floor space, time, and cost, the 3160 can increase production productivity and efficiency with its innovative design. The system is congurable for Single, Dual or Quad test sites and can be upgraded to provide an Active Thermal Control (ATC) System to test the DUT up to 150°C.

3160

71701

61830

7935

58212-C

63203A-150-300

3360

63610-80-20

ASFT 3260

19035	

63206A-150-600

3360P 

3650

63802

62024P-80-60

7940

Chroma 3240 is an innovative handler for high volume/multi-site IC testing at system level. It is capable of handling packages of various types including QFP, TQFP, BGA, PGA, etc. The handler uses pick and place technology to pick up devices from JEDEC trays, move them to the test site, then move them to the appropriate bin after test. It features a 90-degree device rotation which is
required for various pin one orientations.

3240

The Chroma 63804 AC/DC Electronic Load is designed for testing uninterrupted power supplies (UPS), Off-Grid Inverters, AC sources and other power devices such as switches, circuit breakers, fuses and connectors. The 63804 AC/DC Electronic Load can simulate load conditions under high crest factor and varying power factors with real time compensation even when the voltage waveform is distorted. 

63804

3260 SLT

The Chroma 3240-Q is an innovative handler with integration of RF/Wireless isolation chamber. The system is configured for up to octalsite with individual isolation for true parallel test. With a streamlined automation sequence, precise  Pick & Place system, flexible test site configuration, high throughput and low jam rate, the 3240-Q is ideal for RF/Wireless production.

3240-Q

6334

61601

Programmable AC Source 0~300V, 15~1KHz / 2KVA

61604

3260

3110TT

3111

The Chroma 3110-FT is an innovative pick & place system ideal for characteristics evaluation, development, and IC final test.
The system is capable of handling a vast variety of device types and sizes ranging from 3x3 mm to 45x45 mm. To further increase productivity, the 3110-FT offers an optional remote control function allowing operating the handler from any location via an internet connection. The 3110-FT also comprises soaking buffer that can improve the testing cycle time and throughput. Equipped with two auto output tray stacks and two manual output trays, the 3110-FT can maximize the loading and unloading capacity to save the cost and time all within a 1.4 m² floor space.

3110-FT

Capacitor Leakage Current / IR Meter 650V

11200

3250

66202

Chroma 58183 is a PC base test system for LED light bar electrical test. In hardware design, Chroma 58183 not only offers a accurately current (10uA~5mA) to test LED electrical features but also can integrate an extra high power supply for high current test. Otherwise, Chroma 58183 offers multi-channels test function. It is widely used in many application. In LED light bar manufactory, 58183 can test more 10 pieces Light bar at the one time. In LED backlight manufactory, 58183 can test 4 pieces LED backlight via a 4 channels control box. To sum up, 58183 is a very strong and powerful tool for LED light bar and LED backlight manufactories.

58183

58630

6404

58640

The Chroma 29130/29132/29133/29135 LCM ATS utilizes the computer based system to integrate the signal source /power source for LCM patterns and electricity specification tests, also equips with easy-to-use system program for Timing/Pattern/ Power/Program editing, mouse or keypad for LCM defect log, system self test for electricity judgment and rapid selection for defect types greatly reduce the test time in production line.

29132

3380P 

6304

19052

The Chroma 58173, in automatic operation, comes with unique design and a whole new method for LED total power measurement. In bare wafer/chip LED test production, partial flux correction of total flux is the common measurement method in LED epitaxy industry. (See Figure 3 on flip page) However, conventional method causes some disadvantages, i.e., lower accuracy, low S/N ratio, and slow test time etc., and which are difficult to be applied on LED bar wafer/chip total power/flux test production. 

6" Fab For Sale from Moov - Click Here to Learn More

6" Fab For Sale from Moov - Click Here to Learn More

6" Fab For Sale from Moov - Click Here to Learn More

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71701

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